Erratum: High-pressure thermal oxidation of gallium arsenide at 250°C

1988 ◽  
Vol 24 (2) ◽  
pp. 134
Author(s):  
K.N. Bhat ◽  
N. Basu
1987 ◽  
Vol 23 (24) ◽  
pp. 1329 ◽  
Author(s):  
K.N. Bhat ◽  
N. Basu

1991 ◽  
Vol 44 (9) ◽  
pp. 4214-4234 ◽  
Author(s):  
J. M. Besson ◽  
J. P. Itié ◽  
A. Polian ◽  
G. Weill ◽  
J. L. Mansot ◽  
...  

1990 ◽  
Vol 57 (16) ◽  
pp. 1681-1683 ◽  
Author(s):  
D. K. Sadana ◽  
J. P. de Souza ◽  
F. Cardone

1990 ◽  
Vol 204 ◽  
Author(s):  
J.B. Cross ◽  
M.A. Hoffbauer ◽  
J.D. Farr ◽  
O.J. Glembocki ◽  
V.M. Bermudez

ABSTRACTOxide layers that are thick (>200 Å and uniform have been produced on GaAs (110) and (100) by reacting the substrate (Ts<160°C) with high translational energy (1-3 eV) neutral atomic oxygen at flux levels of∼50 monolayers/second. The Ga and As species are formed in their highest oxidation states, which implies formation of either Ga2O3 and As2O5 or GaAsO4. Raman spectroscopy indicates that there is no metallic (amorphous or crystalline) As in the oxide or at the interface between the oxide and substrate and that there is no appreciable oxidation induced disorder of the substrate as is seen in high temperature thermal oxidation processes.


2007 ◽  
Vol 414 (2) ◽  
pp. 152-154 ◽  
Author(s):  
P. K. Penskoi ◽  
V. F. Kostryukov ◽  
V. R. Pshestanchik ◽  
I. Ya. Mittova

1987 ◽  
Vol 50 (11) ◽  
pp. 688-690 ◽  
Author(s):  
Seong S. Choi ◽  
M. Z. Numan ◽  
W. K. Chu ◽  
J. K. Srivastava ◽  
E. A. Irene

2015 ◽  
Vol 51 (7) ◽  
pp. 575-577 ◽  
Author(s):  
J. Li ◽  
Y. Tian ◽  
D.C. Hall

1988 ◽  
Vol 63 (2) ◽  
pp. 506-509 ◽  
Author(s):  
R. G. Gann ◽  
K. M. Geib ◽  
C. W. Wilmsen ◽  
J. Costello ◽  
G. Hrychowain ◽  
...  

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