Cluster Secondary Ion Mass Spectrometry
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Published By John Wiley & Sons, Inc.

9781118589335, 9780470886052

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Cluster Secondary Ion Mass Spectrometry (SIMS) For Semiconductor and Metals Depth Profiling

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch7 ◽

2013 ◽

pp. 247-268

Author(s):

Greg Gillen ◽

Joe Bennett

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Frontmatter

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.fmatter ◽

2013 ◽

pp. i-xiii

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Three-Dimensional Imaging with Cluster Ion Beams

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch6 ◽

2013 ◽

pp. 207-246 ◽

Cited By ~ 4

Author(s):

Andreas Wucher ◽

Gregory L. Fisher ◽

Christine M. Mahoney

Keyword(s):

Three Dimensional ◽

Ion Beams ◽

Three Dimensional Imaging ◽

Cluster Ion Beams ◽

Cluster Ion

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Cluster TOF-SIMS Imaging and the Characterization of Biological Materials

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch8 ◽

2013 ◽

pp. 269-312 ◽

Cited By ~ 6

Author(s):

John Vickerman ◽

Nick Winograd

Keyword(s):

Biological Materials ◽

Tof Sims

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Ion Sources Used for Secondary Ion Mass Spectrometry

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch3 ◽

2013 ◽

pp. 57-75 ◽

Cited By ~ 2

Author(s):

Albert J. Fahey

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Sources ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Index

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.index ◽

2013 ◽

pp. 329-348

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An Introduction to Cluster Secondary Ion Mass Spectrometry (Cluster SIMS)

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch1 ◽

2013 ◽

pp. 1-11 ◽

Cited By ~ 2

Author(s):

Christine M. Mahoney ◽

Greg Gillen

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Cluster Sims ◽

Secondary Ion

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Molecular Depth Profiling with Cluster Ion Beams

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch5 ◽

2013 ◽

pp. 117-205 ◽

Cited By ~ 5

Author(s):

Christine M. Mahoney ◽

Andreas Wucher

Keyword(s):

Depth Profiling ◽

Ion Beams ◽

Molecular Depth Profiling ◽

Cluster Ion Beams ◽

Cluster Ion

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Surface Analysis of Organic Materials with Polyatomic Primary Ion Sources

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch4 ◽

2013 ◽

pp. 77-116

Author(s):

Christine M. Mahoney

Keyword(s):

Surface Analysis ◽

Organic Materials ◽

Ion Sources

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Cluster SIMS of Organic Materials: Theoretical Insights

Cluster Secondary Ion Mass Spectrometry ◽

10.1002/9781118589335.ch2 ◽

2013 ◽

pp. 13-55

Author(s):

Arnaud Delcorte ◽

Oscar A. Restrepo ◽

Bartlomiej Czerwinski

Keyword(s):

Organic Materials ◽

Cluster Sims

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