Role of fluctuations in carrier transfer in semiconductor heterostructures

2006 ◽  
Vol 138 (10-11) ◽  
pp. 546-548 ◽  
Author(s):  
I.V. Rozhansky ◽  
N.S. Averkiev
2021 ◽  
Vol 129 (2) ◽  
pp. 025301
Author(s):  
Vitaly S. Proshchenko ◽  
Manoj Settipalli ◽  
Artem K. Pimachev ◽  
Sanghamitra Neogi

2020 ◽  
Vol 8 (42) ◽  
pp. 14834-14844
Author(s):  
Piotr Piatkowski ◽  
Sofia Masi ◽  
Pavel Galar ◽  
Mario Gutiérrez ◽  
Thi Tuyen Ngo ◽  
...  

Charge-carrier transfer (CT) from the perovskite host to PbS QDs were studied using fs-transient absorption and THz techniques. The CT rate constants increase with the size of QDs due to a change in the position of valence and conduction bands in PbS QDs.


ACS Nano ◽  
2011 ◽  
Vol 5 (6) ◽  
pp. 5045-5055 ◽  
Author(s):  
Lazaro A. Padilha ◽  
István Robel ◽  
Doh C. Lee ◽  
Prashant Nagpal ◽  
Jeffrey M. Pietryga ◽  
...  

Nanoscale ◽  
2020 ◽  
Vol 12 (32) ◽  
pp. 16956-16966 ◽  
Author(s):  
Jia-Chi Lan ◽  
Junpeng Qiao ◽  
Wei-Heng Sung ◽  
Chun-Hu Chen ◽  
Ren-Huai Jhang ◽  
...  

By fabricating graphene/Bi2Te3 heterojunction, the mechanism of carrier-transfer resulting in enhanced optical nonlinearity was investigated. The rapid over-saturation of Bi2Te3 is solved and a better performance is acquired in Q-switched laser.


1986 ◽  
Vol 77 ◽  
Author(s):  
A. F. J. Levi ◽  
R. T. Tung ◽  
J. L. Batstone ◽  
J. M. Gibson ◽  
M. Anzlowar ◽  
...  

ABSTRACTAbrupt, epitaxial silicide/silicon heterostructures may be grown so that, for the first time, the physics of electron transport across near perfect, single crystal, metal/semiconductor interfaces may be probed experimentally. Transport measurements through type-A and -B oriented NiSi2 layers on Si(111) substrates have revealed Schottky barrier heights differing by 140 meV. In this paper we present results of experiments designed to explore the possible role of bulk and interface defects in determining the potential barrier at these near ideal epitaxial metal-semiconductor contacts. We have found little evidence for the presence of defects and the Schottky barrier is insensitive to details of the microscopic interfacial perfection. By contrast we find that both the electrical quality and magnitude of the barrier occurring at the NiSi2 /Si(100) heterojunction are dependent upon details of the microscopic interfacial perfection.


1994 ◽  
Vol 65 (10) ◽  
pp. 1287-1289 ◽  
Author(s):  
W. Grieshaber ◽  
C. Bodin ◽  
J. Cibert ◽  
J. Gaj ◽  
Y. Merle d’Aubigné ◽  
...  

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