Single device on-chip feedthrough cancellation for enhanced electrical characterization of piezoelectric-on-silicon resonators in liquid

2017 ◽  
Vol 260 ◽  
pp. 131-138 ◽  
Author(s):  
A. Ali ◽  
J.E.-Y. Lee
Keyword(s):  
Electrical Characterization ◽  
Silicon Resonators ◽  
On Chip

Experimental electrical characterization of on-chip interconnects

2002 ◽  
Author(s):  
B. Biswas ◽  
A. Glasser ◽  
S. Lipa ◽  
M. Steer ◽  
P. Franzon ◽  
...  
Keyword(s):  
Electrical Characterization ◽  
On Chip

Electrical characterization of carbon nanofibers for on-chip interconnect applications

2005 ◽  
Author(s):  
Quoc Ngo ◽  
S. Krishnan ◽  
A.M. Cassell ◽  
Y. Ominami ◽  
Jun Li ◽  
...  
Keyword(s):  
Carbon Nanofibers ◽  
Electrical Characterization ◽  
On Chip

On-Chip MOSFET Temperature Sensor for Electrical Characterization of RF Circuits

2013 ◽  
Vol 13 (9) ◽  
pp. 3343-3344 ◽  
Author(s):  
Ferran Reverter ◽  
Didac Gomez ◽  
Josep Altet
Keyword(s):  
Temperature Sensor ◽  
Electrical Characterization ◽  
Rf Circuits ◽  
On Chip

Structural and Electrical Characterization of Shaped Beam Laser Recrystallized Polysilicon on Amorphous Substrates

1981 ◽  
Vol 4 ◽  
Author(s):  
T. J. Stultz ◽  
J. F. Gibbons
Keyword(s):  
Grain Size ◽  
Electrical Characterization ◽  
Grain Structure ◽  
Electrical Characteristics ◽  
Shaped Beam ◽  
Beam Laser ◽  
Cw Laser ◽  
Amorphous Substrates ◽  
Circular Beam

ABSTRACTStructural and electrical characterization of laser recrystallized LPCVD silicon films on amorphous substrates using a shaped cw laser beam have been performed. In comparing the results to data obtained using a circular beam, it was found that a significant increase in grain size can be achieved and that the surface morphology of the shaped beam recrystallized material was much smoother. It was also found that whereas circular beam recrystallized material has a random grain structure, shaped beam material is highly oriented with a <100> texture. Finally the electrical characteristics of the recrystallized film were very good when measured in directions parallel to the grain boundaries.

Vapor Deposition Polymerization and Electrical Characterization of TPD Thin Films

2011 ◽  
Vol E94-C (2) ◽  
pp. 157-163 ◽  
Author(s):  
Masakazu MUROYAMA ◽  
Ayako TAJIRI ◽  
Kyoko ICHIDA ◽  
Seiji YOKOKURA ◽  
Kuniaki TANAKA ◽  
...  
Keyword(s):  
Thin Films ◽  
Vapor Deposition ◽  
Electrical Characterization
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