Gate threshold voltage instability and on-resistance degradation under reverse current conduction stress on E-mode GaN-HEMTs
Keyword(s):
2019 ◽
Vol 40
(8)
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pp. 1253-1256
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2019 ◽
Vol 40
(4)
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pp. 518-521
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Keyword(s):
2018 ◽
Vol 88-90
◽
pp. 636-640
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