Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs

Dae-Hyun Kim; Soonyoung Cha; Linda S. Milor

doi:10.1016/j.microrel.2015.06.077

Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs

Microelectronics Reliability ◽

10.1016/j.microrel.2015.06.077 ◽

2015 ◽

Vol 55 (9-10) ◽

pp. 2113-2118 ◽

Cited By ~ 2

Author(s):

Dae-Hyun Kim ◽

Soonyoung Cha ◽

Linda S. Milor

Keyword(s):

Gate Oxide ◽

Carrier Injection ◽

Temperature Instability ◽

Oxide Breakdown ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection ◽

Self Test ◽

Built In Self Test

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Modeling of the reliability degradation of a FinFET-based SRAM due to bias temperature instability, hot carrier injection, and gate oxide breakdown

2017 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2017.8361243 ◽

2017 ◽

Cited By ~ 4

Author(s):

Rui Zhang ◽

Taizhi Liu ◽

Kexin Yang ◽

Linda Milor

Keyword(s):

Gate Oxide ◽

Carrier Injection ◽

Temperature Instability ◽

Oxide Breakdown ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown

Microelectronics Reliability ◽

10.1016/j.microrel.2015.06.008 ◽

2015 ◽

Vol 55 (9-10) ◽

pp. 1334-1340 ◽

Cited By ~ 17

Author(s):

Taizhi Liu ◽

Chang-Chih Chen ◽

Soonyoung Cha ◽

Linda Milor

Keyword(s):

Gate Oxide ◽

System Level ◽

Gate Delay ◽

Delay Model ◽

Carrier Injection ◽

Level Variation ◽

Oxide Breakdown ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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Reliability Analysis for Deuterium Incorporated Gate Oxide Film through Negative-bias Temperature Instability and Hot-carrier Injection

Journal of the Korean Institute of Electrical and Electronic Material Engineers ◽

10.4313/jkem.2008.21.8.687 ◽

2008 ◽

Vol 21 (8) ◽

pp. 687-694

Author(s):

Jae-Sung Lee

Keyword(s):

Oxide Film ◽

Reliability Analysis ◽

Gate Oxide ◽

Negative Bias ◽

Carrier Injection ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2016.2520658 ◽

2016 ◽

Vol 24 (8) ◽

pp. 2712-2725 ◽

Cited By ~ 15

Author(s):

Chang-Chih Chen ◽

Taizhi Liu ◽

Linda Milor

Keyword(s):

System Level ◽

Carrier Injection ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection ◽

System Level Modeling ◽

Microprocessor Reliability

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SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection

2016 IEEE 34th International Conference on Computer Design (ICCD) ◽

10.1109/iccd.2016.7753284 ◽

2016 ◽

Cited By ~ 14

Author(s):

Taizhi Liu ◽

Chang-Chih Chen ◽

Jiadong Wu ◽

Linda Milor

Keyword(s):

Stability Analysis ◽

Carrier Injection ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection ◽

Cache Configurations

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System On Microheater for On-Chip Annealing of Defects Generated by Hot-Carrier Injection, Bias Temperature Instability, and Ionizing Radiation

IEEE Electron Device Letters ◽

10.1109/led.2016.2616133 ◽

2016 ◽

Vol 37 (12) ◽

pp. 1543-1546 ◽

Cited By ~ 8

Author(s):

Jin-Woo Han ◽

Mo Kebaili ◽

M. Meyyappan

Keyword(s):

Ionizing Radiation ◽

Carrier Injection ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection ◽

On Chip

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MOSFET drain current reduction under Fowler–Nordheim and channel hot carrier injection before gate oxide breakdown

Materials Science in Semiconductor Processing ◽

10.1016/j.mssp.2004.09.114 ◽

2004 ◽

Vol 7 (4-6) ◽

pp. 175-180 ◽

Cited By ~ 7

Author(s):

Simone Gerardin ◽

Andrea Cester ◽

Alessandro Paccagnella ◽

Gabriella Ghidini

Keyword(s):

Drain Current ◽

Gate Oxide ◽

Carrier Injection ◽

Oxide Breakdown ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Current Reduction

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Hot carrier injection and negative bias temperature instability induced NMOS and PMOS degradation on CMOS Ring Oscillator

2016 Annual Reliability and Maintainability Symposium (RAMS) ◽

10.1109/rams.2016.7448024 ◽

2016 ◽

Cited By ~ 1

Author(s):

Insaf Lahbib ◽

Mohamed Aziz Doukkali ◽

Patrick Martin ◽

Guy Imbert

Keyword(s):

Ring Oscillator ◽

Negative Bias ◽

Carrier Injection ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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The study of compressive and tensile stress on MOSFET's I-V, C-V characteristics and it's impacts on hot carrier injection and negative bias temperature instability

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. ◽

10.1109/relphy.2003.1197831 ◽

2003 ◽

Cited By ~ 5

Author(s):

J.R. Shih ◽

J.J. Wang ◽

W. Ken ◽

Yeng Peng ◽

J.T. Yue

Keyword(s):

Tensile Stress ◽

Negative Bias ◽

Carrier Injection ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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Vacuum gate dielectric gate-all-around nanowire for hot carrier injection and bias temperature instability free transistor

Applied Physics Letters ◽

10.1063/1.4885595 ◽

2014 ◽

Vol 104 (25) ◽

pp. 253506 ◽

Cited By ~ 12

Author(s):

Jin-Woo Han ◽

Dong-Il Moon ◽

Jae Sub Oh ◽

Yang-Kyu Choi ◽

M. Meyyappan

Keyword(s):

Gate Dielectric ◽

Carrier Injection ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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