2017 IEEE International Integrated Reliability Workshop (IIRW)
Latest Publications

TOTAL DOCUMENTS

36
(FIVE YEARS 0)

H-INDEX

3
(FIVE YEARS 0)

Published By IEEE

9781538623329
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Reliability and modeling: What to simulate and how?

2017 ◽  
Author(s):  
Rui Zhang ◽  
Giovanni Verzellesi ◽  
Giuseppina Puzzilli ◽  
Katja Puschkarsky ◽  
Charles LaRow ◽  
...  

Study of HTO-based alternative gate oxides for high voltage transistors on advanced eNVM technology

2017 ◽  
Author(s):  
Dann Morillon ◽  
Clement Pribat ◽  
Franck Julien ◽  
Nathalie Cherault ◽  
Jerome Goy ◽  
...  
Keyword(s):  
High Voltage ◽  
Gate Oxides

Wafer level EDMR: Magnetic resonance in a probing station

2017 ◽  
Author(s):  
Duane J. McCrory ◽  
Mark A. Anders ◽  
Jason T Ryan ◽  
Pragya R. Shrestha ◽  
Jason P. Campbell ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Wafer Level
Load More ...
Sign in / Sign up

Export Citation Format

Share Document