Depth profiling analysis of HfON on SiON ultrathin films by parallel angle resolved x-ray photoelectron spectroscopy and medium energy ion scattering
Keyword(s):
1995 ◽
Vol 13
(3)
◽
pp. 1325-1330
◽
2003 ◽
Vol 3
(1)
◽
pp. 75-82
◽
Keyword(s):
Keyword(s):