2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual
Latest Publications

TOTAL DOCUMENTS

172

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

1424409187, 1424409195

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An Investigation of Self-Heating Degradation of Metal Induced Laterally Crystallized N-Type Polysilicon Thin Film Transistors

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369574 ◽

2007 ◽

Author(s):

Huaisheng Wang ◽

Mingxiang Wang ◽

Zhenyu Yang ◽

Man Wong

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Self Heating

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On the Interaction Between Inter-Metal Dielectric Reliability and Electromigration Stress

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369991 ◽

2007 ◽

Cited By ~ 1

Author(s):

Yunlong Li ◽

Christophe Bruynseraede ◽

Guido Groeseneken ◽

Karen Maex ◽

Zsolt Tokei

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Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369945 ◽

2007 ◽

Cited By ~ 2

Author(s):

A. Douin ◽

V. Pouget ◽

D. Lewis ◽

P. Fouillat ◽

P. Perdu

Keyword(s):

Integrated Circuits ◽

Timing Analysis ◽

Pulsed Laser ◽

Laser Stimulation

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Statistical Investigation of Random Telegraph Noise ID Instabilities in Flash Cells at Different Initial Trap-filling Conditions

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369886 ◽

2007 ◽

Cited By ~ 15

Author(s):

C. Monzio Compagnoni ◽

R. Gusmeroli ◽

A. S. Spinelli ◽

A. L. Lacaita ◽

M. Bonanomi ◽

...

Keyword(s):

Statistical Investigation ◽

Random Telegraph Noise ◽

Telegraph Noise ◽

Trap Filling

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The Effect of Metal Area and Line Spacing on TDDB Characteristics of 45nm Low-k SiCOH Dielectrics

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369920 ◽

2007 ◽

Cited By ~ 25

Author(s):

F. Chen ◽

P. McLaughlin ◽

J. Gambino ◽

E. Wu ◽

J. Demarest ◽

...

Keyword(s):

Line Spacing ◽

Low K

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A Critical Enhancement in the Yield Analysis of Microsystems

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369927 ◽

2007 ◽

Cited By ~ 6

Author(s):

Shyam Praveen Vudathu ◽

Duane Boning ◽

Rainer Laur

Keyword(s):

Yield Analysis

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Moisture Related Low-K Dielectric Reliability Before and After Thermal Annealing

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369923 ◽

2007 ◽

Cited By ~ 6

Author(s):

Yunlong Li ◽

Ivan Ciofi ◽

Laureen Carbonell ◽

Guido Groeseneken ◽

Karen Maex ◽

...

Keyword(s):

Thermal Annealing ◽

Before And After ◽

Low K

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Reliability and Processing Effects of Bandgap Engineered SONOS (BE-SONOS) Flash Memory

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369888 ◽

2007 ◽

Cited By ~ 11

Author(s):

Szu-Yu Wang ◽

Hang-Ting Lue ◽

Erh-Kun Lai ◽

Ling-Wu Yang ◽

Tahone Yang ◽

...

Keyword(s):

Flash Memory ◽

Processing Effects

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A Physics-Based Crystallization Model for Retention in Phase-Change Memories

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369949 ◽

2007 ◽

Cited By ~ 7

Author(s):

U. Russo ◽

D. Ielmini ◽

A. L. Lacaita

Keyword(s):

Phase Change

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Novel Robust High Voltage ESD Clamps for LDMOS Protection

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369968 ◽

2007 ◽

Cited By ~ 17

Author(s):

A.J. Walker ◽

S.T. Ward ◽

H. Puchner

Keyword(s):

High Voltage

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2007 IEEE International Reliability Physics Symposium Proceedings. 45th AnnualLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

An Investigation of Self-Heating Degradation of Metal Induced Laterally Crystallized N-Type Polysilicon Thin Film Transistors

On the Interaction Between Inter-Metal Dielectric Reliability and Electromigration Stress

Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation

Statistical Investigation of Random Telegraph Noise ID Instabilities in Flash Cells at Different Initial Trap-filling Conditions

The Effect of Metal Area and Line Spacing on TDDB Characteristics of 45nm Low-k SiCOH Dielectrics

A Critical Enhancement in the Yield Analysis of Microsystems

Moisture Related Low-K Dielectric Reliability Before and After Thermal Annealing

Reliability and Processing Effects of Bandgap Engineered SONOS (BE-SONOS) Flash Memory

A Physics-Based Crystallization Model for Retention in Phase-Change Memories

Novel Robust High Voltage ESD Clamps for LDMOS Protection

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual
Latest Publications