On the Interaction Between Inter-Metal Dielectric Reliability and Electromigration Stress

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ◽

10.1109/relphy.2007.369991 ◽

2007 ◽

Cited By ~ 1

Author(s):

Yunlong Li ◽

Christophe Bruynseraede ◽

Guido Groeseneken ◽

Karen Maex ◽

Zsolt Tokei

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