2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems
Latest Publications

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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Graph Model for Tile Sets in DNA Self-Assembly

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.11 ◽

2008 ◽

Author(s):

Zahra Mashreghian Arani ◽

Masoud Hashempour ◽

Fabrizio Lombardi

Keyword(s):

Self Assembly ◽

Graph Model

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Comparing the Reliability of PLA and Custom Logic Implementations of a QCA Adder

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.20 ◽

2008 ◽

Cited By ~ 2

Author(s):

Timothy J. Dysart ◽

Peter M. Kogge

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Design Tradeoffs for Improved Performance in MQCA-Based Systems

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.23 ◽

2008 ◽

Cited By ~ 4

Author(s):

Michael Niemier ◽

Aaron Dingler ◽

X. Sharon Hu

Keyword(s):

Improved Performance ◽

Design Tradeoffs

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Ones Counting Based Error-Rate Estimation for Multiple Output Circuits

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.18 ◽

2008 ◽

Cited By ~ 4

Author(s):

Zhaoliang Pan ◽

Melvin A. Breuer

Keyword(s):

Error Rate ◽

Rate Estimation

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Combinatorial Optimization Problem in Designing DNA Self-Assembly Tile Sets

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.7 ◽

2008 ◽

Cited By ~ 2

Author(s):

X. Ma ◽

F. Lombardi

Keyword(s):

Combinatorial Optimization ◽

Self Assembly ◽

Optimization Problem ◽

Combinatorial Optimization Problem

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A Highly-Stable Nanometer Memory for Low-Power Design

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.10 ◽

2008 ◽

Cited By ~ 11

Author(s):

Sheng Lin ◽

Yong-Bin Kim ◽

Fabrizio Lombardi

Keyword(s):

Low Power ◽

Low Power Design

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Electromigration Feedback Controlled Nanogaps Fabrication Based on MPTMS Adhesion Layer

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.12 ◽

2008 ◽

Cited By ~ 1

Author(s):

Pierluigi Civera ◽

Danilo Demarchi ◽

Gianluca Piccinini ◽

Matteo Cocuzza ◽

Denis Perrone

Keyword(s):

Adhesion Layer

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Accelerated Functional Testing of Digital Microfluidic Biochips

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.15 ◽

2008 ◽

Cited By ~ 9

Author(s):

Debasis Mitra ◽

Sarmishtha Ghoshal ◽

Hafizur Rahaman ◽

Bhargab B. Bhattacharya ◽

D. Dutta Majumder ◽

...

Keyword(s):

Functional Testing ◽

Microfluidic Biochips ◽

Digital Microfluidic

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Characterization of the Displacement Tolerance of QCA Interconnects

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.9 ◽

2008 ◽

Cited By ~ 1

Author(s):

Faizal Karim ◽

Konrad Walus

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New SRAM Cell Design for Low Power and High Reliability Using 32nm Independent Gate FinFET Technology

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.16 ◽

2008 ◽

Cited By ~ 7

Author(s):

Young Bok Kim ◽

Yong-Bin Kim ◽

Fabrizio Lombardi

Keyword(s):

Low Power ◽

High Reliability ◽

Cell Design ◽

Sram Cell ◽

Independent Gate

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2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A Graph Model for Tile Sets in DNA Self-Assembly

Comparing the Reliability of PLA and Custom Logic Implementations of a QCA Adder

Design Tradeoffs for Improved Performance in MQCA-Based Systems

Ones Counting Based Error-Rate Estimation for Multiple Output Circuits

Combinatorial Optimization Problem in Designing DNA Self-Assembly Tile Sets

A Highly-Stable Nanometer Memory for Low-Power Design

Electromigration Feedback Controlled Nanogaps Fabrication Based on MPTMS Adhesion Layer

Accelerated Functional Testing of Digital Microfluidic Biochips

Characterization of the Displacement Tolerance of QCA Interconnects

New SRAM Cell Design for Low Power and High Reliability Using 32nm Independent Gate FinFET Technology

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems
Latest Publications