Comparing the Reliability of PLA and Custom Logic Implementations of a QCA Adder

2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems ◽

10.1109/ndcs.2008.20 ◽

2008 ◽

Cited By ~ 2

Author(s):

Timothy J. Dysart ◽

Peter M. Kogge

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