2009 27th IEEE VLSI Test Symposium
Latest Publications

TOTAL DOCUMENTS

74

(FIVE YEARS 0)

H-INDEX

16

(FIVE YEARS 0)

Published By IEEE

9780769535982

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

[Front cover]

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.74 ◽

2009 ◽

Keyword(s):

Front Cover

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Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.39 ◽

2009 ◽

Author(s):

Haluk Konuk

Keyword(s):

Defect Detection ◽

Flip Flop ◽

Sense Amplifier

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Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.45 ◽

2009 ◽

Cited By ~ 37

Author(s):

Junxia Ma ◽

Jeremy Lee ◽

Mohammad Tehranipoor

Keyword(s):

Pattern Generation ◽

Noise Effects ◽

Supply Noise ◽

Critical Paths

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Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.18 ◽

2009 ◽

Cited By ~ 5

Author(s):

Yong-Jyun Hu ◽

Yu-Jen Huang ◽

Jin-Fu Li

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Maintaining Accuracy of Test Compaction through Adaptive Re-learning

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.59 ◽

2009 ◽

Cited By ~ 5

Author(s):

Sounil Biswas ◽

R. D. Blanton

Keyword(s):

Test Compaction

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A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.44 ◽

2009 ◽

Cited By ~ 5

Author(s):

Erdem Serkan Erdogan ◽

Sule Ozev

Keyword(s):

Test Solution ◽

Site Test

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Restrict Encoding for Mixed-Mode BIST

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.43 ◽

2009 ◽

Cited By ~ 29

Author(s):

Abdul-Wahid Hakmi ◽

Stefan Holst ◽

Hans-Joachim Wunderlich ◽

Jürgen Schlöffel ◽

Friedrich Hapke ◽

...

Keyword(s):

Mixed Mode

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Automated Debug of Speed Path Failures Using Functional Tests

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.53 ◽

2009 ◽

Cited By ~ 30

Author(s):

Richard McLaughlin ◽

Srikanth Venkataraman ◽

Carlston Lim

Keyword(s):

Functional Tests

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The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.15 ◽

2009 ◽

Cited By ~ 21

Author(s):

Zhen Chen ◽

Dong Xiang ◽

Boxue Yin

Keyword(s):

Fault Coverage ◽

Test Cost ◽

Transition Fault ◽

High Transition

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Analytical Model for Multi-site Efficiency with Parallel to Serial Test Times, Yield and Clustering

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.42 ◽

2009 ◽

Cited By ~ 8

Author(s):

Naveen Velamati ◽

Robert Daasch

Keyword(s):

Analytical Model ◽

Serial Test

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