Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.18 ◽

2009 ◽

Cited By ~ 5

Author(s):

Yong-Jyun Hu ◽

Yu-Jen Huang ◽

Jin-Fu Li

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