Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.45 ◽

2009 ◽

Cited By ~ 37

Author(s):

Junxia Ma ◽

Jeremy Lee ◽

Mohammad Tehranipoor

Keyword(s):

Pattern Generation ◽

Noise Effects ◽

Supply Noise ◽

Critical Paths

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Layout-aware pseudo-functional testing for critical paths considering power supply noise effects

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457037 ◽

2010 ◽

Cited By ~ 3

Author(s):

Xiao Liu ◽

Yubin Zhang ◽

Feng Yuan ◽

Qiang Xu

Keyword(s):

Power Supply ◽

Functional Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise ◽

Critical Paths

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Path selection and pattern generation for dynamic timing analysis considering power supply noise effects

IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) ◽

10.1109/iccad.2000.896521 ◽

2002 ◽

Cited By ~ 14

Author(s):

Jing-Jia Liou ◽

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Path Selection ◽

Pattern Generation ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

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Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.913759 ◽

2001 ◽

Vol 20 (3) ◽

pp. 416-425 ◽

Cited By ~ 66

Author(s):

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Pattern Generation ◽

Delay Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

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Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2163159 ◽

2011 ◽

Vol 30 (12) ◽

pp. 1923-1934 ◽

Cited By ~ 18

Author(s):

Junxia Ma ◽

Mohammad Tehranipoor

Keyword(s):

Power Supply ◽

Critical Path ◽

Maximum Power ◽

Path Delay ◽

Power Supply Noise ◽

Delay Test ◽

Noise Effects ◽

Critical Path Delay ◽

Supply Noise ◽

Path Delay Test

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Delay testing considering power supply noise effects

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) ◽

10.1109/test.1999.805629 ◽

2003 ◽

Cited By ~ 24

Author(s):

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Delay Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

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PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.63 ◽

2008 ◽

Cited By ~ 4

Author(s):

Yi-Tsung Lin ◽

Meng-Fan Wu ◽

Jiun-Lang Huang

Keyword(s):

Power Supply ◽

Test Pattern ◽

Pattern Generation ◽

Huffman Coding ◽

Test Pattern Generation ◽

Scan Testing ◽

Test Compression ◽

Generation Technique ◽

Supply Noise ◽

Noise Test

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On Efficient Behavioral Modeling to Accurately Predict Supply Noise Effects of PLL Designs in Real Systems

2006 IFIP International Conference on Very Large Scale Integration ◽

10.1109/vlsisoc.2006.313214 ◽

2006 ◽

Cited By ~ 3

Author(s):

Chin-cheng Kuo ◽

Chien-nan Liu

Keyword(s):

Behavioral Modeling ◽

Noise Effects ◽

Supply Noise

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An analytical propagation delay model with power supply noise effects

2006 IEEE International Conference on Acoustics Speed and Signal Processing Proceedings ◽

10.1109/iscas.2006.1692664 ◽

2006 ◽

Cited By ~ 3

Author(s):

M. Pude ◽

C. Washburn ◽

P.R. Mukund ◽

K. Abe ◽

Y. Nishi

Keyword(s):

Power Supply ◽

Propagation Delay ◽

Delay Model ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

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Dynamic timing analysis considering power supply noise effects

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) ◽

10.1109/isqed.2000.838866 ◽

2002 ◽

Cited By ~ 5

Author(s):

Y.-M. Jiang ◽

A. Krstic ◽

K.-T. Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

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Accurate behavioral modeling approach for PLL designs with supply noise effects

BMAS 2005. Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop, 2005. ◽

10.1109/bmas.2005.1518186 ◽

2005 ◽

Cited By ~ 1

Author(s):

Chin-Cheng Kuo ◽

Chien-Nan Jimmy Liu

Keyword(s):

Behavioral Modeling ◽

Noise Effects ◽

Modeling Approach ◽

Supply Noise

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