2015 International Workshop on CMOS Variability (VARI)
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2.64 pJ reference-free power supply monitor with a wide temperature range

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456555 ◽

2015 ◽

Cited By ~ 2

Author(s):

Hernan Aparicio ◽

Pablo Ituero ◽

Marisa Lopez-Vallejo

Keyword(s):

Power Supply ◽

Wide Temperature Range ◽

Temperature Range

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An application-specific NBTI ageing analysis method

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456553 ◽

2015 ◽

Author(s):

Haider Muhi Abbas ◽

Mark Zwolinski ◽

Basel Halak

Keyword(s):

Analysis Method ◽

Application Specific

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Author index

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456564 ◽

2015 ◽

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Energy study for 28nm FDSOI technology

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456558 ◽

2015 ◽

Author(s):

Rida Kheirallah ◽

Nadine Azemard ◽

Gilles Ducharme

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2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456565 ◽

2015 ◽

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Exploration of noise robustness and sensitivity of bulk current sensors for soft error detection

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456556 ◽

2015 ◽

Cited By ~ 2

Author(s):

Joao Guilherme Mourao Melo ◽

Frank Sill Torres ◽

Rodrigo Possamai Bastos

Keyword(s):

Error Detection ◽

Soft Error ◽

Noise Robustness ◽

Current Sensors

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Within-die and die-to-die variability on 65nm CMOS : oscillators experimental results

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456559 ◽

2015 ◽

Cited By ~ 1

Author(s):

Juan Pablo Martinez Brito ◽

Marcelo Lubaszewski ◽

Sergio Bampi

Keyword(s):

Experimental Results ◽

Cmos Oscillators

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A noise suppressing filter design for reducing deconvolution error of both-directions downward sloped asymmeric RTN long-tail distributions

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456563 ◽

2015 ◽

Cited By ~ 1

Author(s):

Hiroyuki Yamauchi ◽

Worawit Somha

Keyword(s):

Filter Design ◽

Long Tail ◽

Tail Distributions

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Study and reduction of variability in 28 nm FDSOI technology

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456557 ◽

2015 ◽

Author(s):

Gilles Jacquemod ◽

Zhaopeng Wei ◽

Jad Modad ◽

Yves Leduc ◽

Philippe Lorenzini ◽

...

Keyword(s):

28 Nm

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Is intrinsic noise a limiting factor for subthreshold digital logic in nanoscale CMOS?

2015 International Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2015.7456562 ◽

2015 ◽

Author(s):

Francisco Veirano ◽

Fernando Silveira ◽

Lirida Navinery

Keyword(s):

Intrinsic Noise ◽

Digital Logic ◽

Limiting Factor ◽

Nanoscale Cmos

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2015 International Workshop on CMOS Variability (VARI)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

2.64 pJ reference-free power supply monitor with a wide temperature range

An application-specific NBTI ageing analysis method

Author index

Energy study for 28nm FDSOI technology

Table of contents

Exploration of noise robustness and sensitivity of bulk current sensors for soft error detection

Within-die and die-to-die variability on 65nm CMOS : oscillators experimental results

A noise suppressing filter design for reducing deconvolution error of both-directions downward sloped asymmeric RTN long-tail distributions

Study and reduction of variability in 28 nm FDSOI technology

Is intrinsic noise a limiting factor for subthreshold digital logic in nanoscale CMOS?

Export Citation Format

2015 International Workshop on CMOS Variability (VARI)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

2.64 pJ reference-free power supply monitor with a wide temperature range

An application-specific NBTI ageing analysis method

Author index

Energy study for 28nm FDSOI technology

Table of contents

Exploration of noise robustness and sensitivity of bulk current sensors for soft error detection

Within-die and die-to-die variability on 65nm CMOS : oscillators experimental results

A noise suppressing filter design for reducing deconvolution error of both-directions downward sloped asymmeric RTN long-tail distributions

Study and reduction of variability in 28 nm FDSOI technology

Is intrinsic noise a limiting factor for subthreshold digital logic in nanoscale CMOS?

2015 International Workshop on CMOS Variability (VARI)
Latest Publications