Exploration of noise robustness and sensitivity of bulk current sensors for soft error detection

2015 ◽  
Author(s):  
Joao Guilherme Mourao Melo ◽  
Frank Sill Torres ◽  
Rodrigo Possamai Bastos
Keyword(s):  
Error Detection ◽  
Soft Error ◽  
Noise Robustness ◽  
Current Sensors

scholarly journals Optimized switch-level soft error detection based on advanced switch-level models

2021 ◽  
Author(s):  
Jalal Mohammad Chikhe
Keyword(s):  
Error Detection ◽  
Early Stage ◽  
Soft Errors ◽  
Logic Gate ◽  
Soft Error ◽  
Combinational Circuits ◽  
Single Event Transient ◽  
New Techniques ◽  
Speed Up ◽  
Logic Threshold

Due to the reduction of transistor size, modern circuits are becoming more sensitive to soft errors. The development of new techniques and algorithms targeting soft error detection are important as they allow designers to evaluate the weaknesses of the circuits at an early stage of the design. The project presents an optimized implementation of soft error detection simulator targeting combinational circuits. The developed simulator uses advanced switch level models allowing the injection of soft errors caused by single event-transient pulses with magnitudes lesser than the logic threshold. The ISCAS'85 benchmark circuits are used for the simulations. The transients can be injected at drain, gate, or inputs of logic gate. This gives clear indication of the importance of transient injection location on the fault coverage. Furthermore, an algorithm is designed and implemented in this work to increase the performance of the simulator. This optimized version of the simulator achieved an average speed-up of 310 compared to the non-algorithm based version of the simulator.

Offset DMR: A Low Overhead Soft Error Detection and Correction Technique for Transform-Based Convolution

2011 ◽  
Vol 60 (10) ◽  
pp. 1511-1516 ◽  
Author(s):  
Pedro Reviriego ◽  
Chris Bleakley ◽  
Juan Antonio Maestro ◽  
Anne O'Donnell
Keyword(s):  
Error Detection ◽  
Soft Error ◽  
Correction Technique ◽  
Error Detection And Correction
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