resistive open defects
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scholarly journals Resistive Open Defect Isolation in Nano-Probing

2021 ◽  
Author(s):  
Yunfei Wang ◽  
Hyuk Ju Ryu ◽  
Tom Tong
Keyword(s):  
Electron Beam ◽  
Case Studies ◽  
Induced Resistance ◽  
Resistance Change ◽  
Scanning Capacitance Microscopy ◽  
Capacitance Voltage ◽  
Defect Isolation ◽  
Open Defect ◽  
Open Defects ◽  
Resistive Open Defects

Abstract In this paper, we present case studies of localizing resistive open defects using various FA techniques, including two-terminal IV, two-terminal Electron-Beam Absorbed Current (EBAC), Electron Beam Induced Resistance Change (EBIRCh), Pulsed IV, Capacitance-Voltage (CV) and Scanning Capacitance Microscopy (SCM). The advantage and limitation of each technique will also be discussed.

scholarly journals Postbond Test of Through-Silicon Vias With Resistive Open Defects

2019 ◽  
Vol 27 (11) ◽  
pp. 2596-2607
Author(s):  
Rosa Rodriguez-Montanes ◽  
Daniel Arumi ◽  
Joan Figueras
Keyword(s):  
Through Silicon Vias ◽  
Open Defects ◽  
Silicon Vias ◽  
Resistive Open Defects

Resistive open defects detected by interconnect testing based on charge volume injected to 3D ICs

2017 ◽  
Author(s):  
Kouhei Ohtani ◽  
Naho Osato ◽  
Masaki Hashizume ◽  
Hiroyuki Yotsuyanagi ◽  
Shyue-Kung Lu
Keyword(s):  
Interconnect Testing ◽  
3D Ics ◽  
Open Defects ◽  
Resistive Open Defects

Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations

2016 ◽  
Vol 67 ◽  
pp. 150-158 ◽  
Author(s):  
A.F. Gomez ◽  
F. Lavratti ◽  
G. Medeiros ◽  
M. Sartori ◽  
L. Bolzani Poehls ◽  
...  
Keyword(s):  
Process Variations ◽  
Open Defects ◽  
Resistive Open Defects

Testability for resistive open defects by electrical interconnect test of 3D ICs without boundary scan flip flops

2016 ◽  
Author(s):  
Fara Ashikin Binti Ali ◽  
Masaki Hashizume ◽  
Yuki Ikiri ◽  
Hiroyuki Yotsuyanagi ◽  
Shyue-Kung Lu
Keyword(s):  
Boundary Scan ◽  
3D Ics ◽  
Interconnect Test ◽  
Open Defects ◽  
Resistive Open Defects

Analyzing NBTI impact on SRAMs with resistive-open defects

2016 ◽  
Author(s):  
M. Tulio Martins ◽  
G. Medeiros ◽  
T. Copetti ◽  
F. Vargas ◽  
L. Bolzani Poehls
Keyword(s):  
Open Defects ◽  
Resistive Open Defects

Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs

2015 ◽  
Author(s):  
F. Lavratti ◽  
L. M. Bolzani Poehls ◽  
F. Vargas ◽  
A. Calimera ◽  
E. Macii
Keyword(s):  
Open Defects ◽  
Resistive Open Defects
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