Testability for resistive open defects by electrical interconnect test of 3D ICs without boundary scan flip flops

2016 ◽  
Author(s):  
Fara Ashikin Binti Ali ◽  
Masaki Hashizume ◽  
Yuki Ikiri ◽  
Hiroyuki Yotsuyanagi ◽  
Shyue-Kung Lu
Keyword(s):  
Boundary Scan ◽  
3D Ics ◽  
Interconnect Test ◽  
Open Defects ◽  
Resistive Open Defects

Electrical interconnect test method of 3D ICs without boundary scan flip flops

2015 ◽  
Author(s):  
Masaki Hashizume ◽  
Shoichi Umezu ◽  
Yuki Ikiri ◽  
Fara Ashikin Binti Ali ◽  
Hiroyuki Yotsuyanagi ◽  
...  
Keyword(s):  
Test Method ◽  
Boundary Scan ◽  
3D Ics ◽  
Interconnect Test

Resistive open defects detected by interconnect testing based on charge volume injected to 3D ICs

2017 ◽  
Author(s):  
Kouhei Ohtani ◽  
Naho Osato ◽  
Masaki Hashizume ◽  
Hiroyuki Yotsuyanagi ◽  
Shyue-Kung Lu
Keyword(s):  
Interconnect Testing ◽  
3D Ics ◽  
Open Defects ◽  
Resistive Open Defects

Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs

2007 ◽  
Author(s):  
A. Ney ◽  
P. Girard ◽  
C. Landrault ◽  
S. Pravossoudovitch ◽  
A. Virazel ◽  
...  
Keyword(s):  
Open Defects ◽  
Sense Amplifiers ◽  
Resistive Open Defects

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

2011 ◽  
Vol 58 (3) ◽  
pp. 855-861 ◽  
Author(s):  
P Rech ◽  
J-M Galliere ◽  
P Girard ◽  
F Wrobel ◽  
F Saigne ◽  
...  
Keyword(s):  
Error Rate ◽  
Alpha Particles ◽  
Open Defects ◽  
Resistive Open Defects

Analysis of Resistive-Open Defects in SRAM Sense Amplifiers

2009 ◽  
Vol 17 (10) ◽  
pp. 1556-1559 ◽  
Author(s):  
A. Ney ◽  
P. Girard ◽  
S. Pravossoudovitch ◽  
A. Virazel ◽  
M. Bastian
Keyword(s):  
Open Defects ◽  
Sense Amplifiers ◽  
Resistive Open Defects

A Simulator of Small-Delay Faults Caused by Resistive-Open Defects

2008 ◽  
Author(s):  
Alejandro Czutro ◽  
Nicolas Houarche ◽  
Piet Engelke ◽  
Ilia Polian ◽  
Mariane Comte ◽  
...  
Keyword(s):  
Delay Faults ◽  
Small Delay ◽  
Open Defects ◽  
Resistive Open Defects
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