Efficient SMT-based ATPG for interconnect open defects

2014 ◽  
Author(s):  
Dominik Erb ◽  
Karsten Scheibler ◽  
Matthias Sauer ◽  
Bernd Becker
Keyword(s):  
Open Defects

Open Localization in Micro LeadFrame Package Using Space Domain Reflectometry

2013 ◽  
Author(s):  
J. Gaudestad ◽  
V. Talanov ◽  
A. Orozco ◽  
M. Marchetti
Keyword(s):  
Magnetic Field ◽  
Radio Frequency ◽  
Standing Wave ◽  
High Resistance ◽  
Space Domain ◽  
The Past ◽  
Open Defects ◽  
Rf Electronics ◽  
Rf Signal ◽  
The Magnetic Field

Abstract In the past couple years, Space Domain Reflectometry (SDR) has become a mainstream method to locate open defects among the major semiconductor manufacturers. SDR injects a radio frequency (RF) signal into the open trace creating a standing wave with a node at the open location. The magnetic field generated by the standing wave is imaged with a SQUID sensor using RF electronics. In this paper, we show that SDR can be used to non-destructively locate high resistance failures in Micro LeadFrame Packages (MLP).

Fault Isolation of Open Defects Using Space Domain Reflectometry

2012 ◽  
Author(s):  
Mayue Xie ◽  
Zhiguo Qian ◽  
Mario Pacheco ◽  
Zhiyong Wang ◽  
Rajen Dias ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Fault Isolation ◽  
Nondestructive Technique ◽  
Space Domain ◽  
New Approach ◽  
Defect Localization ◽  
Open Faults ◽  
Open Defects ◽  
Application Optimization ◽  
Rf Magnetic Field

Abstract Recently, a new approach for isolation of open faults in integrated circuits (ICs) was developed. It is based on mapping the radio-frequency (RF) magnetic field produced by the defective part fed with RF probing current, giving the name to Space Domain Reflectometry (SDR). SDR is a non-contact and nondestructive technique to localize open defects in package substrates, interconnections and semiconductor devices. It provides 2D failure isolation capability with defect localization resolution down to 50 microns. It is also capable of scanning long traces in Si. This paper describes the principles of the SDR and its application for the localization of open and high resistance defects. It then discusses some analysis methods for application optimization, and gives examples of test samples as well as case studies from actual failures.

Detecting and diagnosing open defects

2010 ◽  
Author(s):  
Dat Tran ◽  
LeRoy Winemberg ◽  
Darrell Carder ◽  
Xijiang Lin ◽  
Joe LeBritton ◽  
...  
Keyword(s):  
Open Defects
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