Voltage- and current-based fault simulation for interconnect open defects

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.

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Open Localization in Micro LeadFrame Package Using Space Domain Reflectometry

ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2013p0270 ◽

2013 ◽

Author(s):

J. Gaudestad ◽

V. Talanov ◽

A. Orozco ◽

M. Marchetti

Keyword(s):

Magnetic Field ◽

Radio Frequency ◽

Standing Wave ◽

High Resistance ◽

Space Domain ◽

The Past ◽

Open Defects ◽

Rf Electronics ◽

Rf Signal ◽

The Magnetic Field

Abstract In the past couple years, Space Domain Reflectometry (SDR) has become a mainstream method to locate open defects among the major semiconductor manufacturers. SDR injects a radio frequency (RF) signal into the open trace creating a standing wave with a node at the open location. The magnetic field generated by the standing wave is imaged with a SQUID sensor using RF electronics. In this paper, we show that SDR can be used to non-destructively locate high resistance failures in Micro LeadFrame Packages (MLP).

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Fault Isolation of Open Defects Using Space Domain Reflectometry

ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2012p0011 ◽

2012 ◽

Author(s):

Mayue Xie ◽

Zhiguo Qian ◽

Mario Pacheco ◽

Zhiyong Wang ◽

Rajen Dias ◽

...

Keyword(s):

Integrated Circuits ◽

Fault Isolation ◽

Nondestructive Technique ◽

Space Domain ◽

New Approach ◽

Defect Localization ◽

Open Faults ◽

Open Defects ◽

Application Optimization ◽

Rf Magnetic Field

Abstract Recently, a new approach for isolation of open faults in integrated circuits (ICs) was developed. It is based on mapping the radio-frequency (RF) magnetic field produced by the defective part fed with RF probing current, giving the name to Space Domain Reflectometry (SDR). SDR is a non-contact and nondestructive technique to localize open defects in package substrates, interconnections and semiconductor devices. It provides 2D failure isolation capability with defect localization resolution down to 50 microns. It is also capable of scanning long traces in Si. This paper describes the principles of the SDR and its application for the localization of open and high resistance defects. It then discusses some analysis methods for application optimization, and gives examples of test samples as well as case studies from actual failures.

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Diagnostic Fault Simulation for the Failure Analyst

ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2004p0181 ◽

2004 ◽

Author(s):

Dan Bodoh ◽

Anthony Blakely ◽

Terry Garyet

Keyword(s):

Fault Diagnosis ◽

Failure Analysis ◽

Complete Solution ◽

Fault Simulation ◽

Building Blocks ◽

Physical World ◽

Design For Test ◽

Fault Diagnosis System ◽

Diagnosis Algorithm ◽

Diagnosis Tool

Abstract Since failure analysis (FA) tools originated in the design-for-test (DFT) realm, most have abstractions that reflect a designer's viewpoint. These abstractions prevent easy application of diagnosis results in the physical world of the FA lab. This article presents a fault diagnosis system, DFS/FA, which bridges the DFT and FA worlds. First, it describes the motivation for building DFS/FA and how it is an improvement over off-the-shelf tools and explains the DFS/FA building blocks on which the diagnosis tool depends. The article then discusses the diagnosis algorithm in detail and provides an overview of some of the supporting tools that make DFS/FA a complete solution for FA. It also presents a FA example where DFS/FA has been applied. The example demonstrates how the consideration of physical proximity improves the accuracy without sacrificing precision.

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