Data Disturbance-free NAND-type Ferroelectric-gate Thin Film Transistor Array using Solution-processed ITO and Stacked (BLT/PZT) Gate Insulator
2017 ◽
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2019 ◽
Vol 476
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pp. 374-377
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2016 ◽
Vol 16
(3)
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pp. 2632-2636
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1998 ◽
Vol 45
(12)
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pp. 2548-2551
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