scholarly journals Research on characteristics degradation of n-metal-oxide-semiconductor field-effect transistor induced by hot carrier effect due to high power microwave

2012 ◽  
Vol 61 (10) ◽  
pp. 108501
Author(s):  
You Hai-Long ◽  
Lan Jian-Chun ◽  
Fan Ju-Ping ◽  
Jia Xin-Zhang ◽  
Zha Wei
Keyword(s):  
Field Effect ◽  
Field Effect Transistor ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
High Power Microwave ◽  
Hot Carrier ◽  
Carrier Effect ◽  
Effect Transistor ◽  
Hot Carrier Effect ◽  
Power Microwave

Hot Carrier Effect in UltraThin Gate Oxide Metal Oxide Semiconductor Field Effect Transistor

2005 ◽  
Vol 44 (8) ◽  
pp. 5889-5892 ◽  
Author(s):  
Yukiharu Uraoka ◽  
Hiroyuki Honda ◽  
Takashi Fuyuki ◽  
Takaoki Sasaki ◽  
Mitsuo Yasuhira
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Gate Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Hot Carrier ◽  
Carrier Effect ◽  
Effect Transistor ◽  
Hot Carrier Effect
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