scholarly journals P4.3 - Integrated System Scanning Probe Microscope - Quartz Microbalance: in-situ Testing of Surface Potential, Topography and mass of the adsorbed gases.

2011 ◽  
Author(s):  
V. S. Popov ◽  
R. G. Pavelko ◽  
V. G. Sevastynov ◽  
N. T. Kuznetsov ◽  
N. S. Kurnaakov
Keyword(s):  
Surface Potential ◽  
Scanning Probe Microscope ◽  
Integrated System ◽  
Scanning Probe ◽  
In Situ Testing ◽  
Quartz Microbalance ◽  
Probe Microscope

AFM-Based Testing and Measurements of Contact and Stiction in a Micromechanical Switch

2004 ◽  
Author(s):  
Lei Chen ◽  
Nicol E. McGruer ◽  
George G. Adams
Keyword(s):  
Contact Resistance ◽  
Scanning Probe Microscope ◽  
The Other ◽  
Scanning Probe ◽  
Repeated Loading ◽  
Experimental Setup ◽  
Fundamental Physics ◽  
High Stiffness ◽  
Probe Microscope

Cycling of a micromechanical switch with gold-on-gold contacts demonstrates that the contact resistance decreases and the adherence force increases. An experimental setup using a Scanning Probe Microscope (SPM) is allowing the fundamental physics of this behavior to be better understood. The setup includes two side-by-side cantilevers — one of high stiffness which applies the repeated loading and the other a standard profiling cantilever allowing in-situ measurements of topographical changes.

Scanning Probe Microscope Observation of Recorded Marks in Phase Change Disks

2001 ◽  
Vol 7 (4) ◽  
pp. 363-367
Author(s):  
Takashi Kikukawa ◽  
Hajime Utsunomiya
Keyword(s):  
Phase Change ◽  
Surface Potential ◽  
Detection Method ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
The Novel ◽  
Transmission Electron ◽  
Potential Mode ◽  
Probe Microscope ◽  
Conventional Transmission Electron Microscope

AbstractThis is the first report on observation of phase change recorded marks by use of the scanning probe microscope (SPM). The amorphous mark and crystalline blank were clearly observed by surface potential mode (SPoM) that visualized the surface potential difference among phases or materials. SPoM observation has an advantage over conventional transmission electron microscope (TEM) observation in that the sample preparation is much easier, and that amorphous mark and crystalline blank are clearly distinguished. The possibility of a novel readout method of phase change disks, and the possibility of the novel medium with a surface potential detection method are also proposed.

scholarly journals In situ chemical sensing by using scanning probe microscope

2019 ◽  
Vol 153 (6) ◽  
pp. 267-272
Author(s):  
Yasufumi Takahashi ◽  
Yuanshu Zhou ◽  
Takeshi Fukuma
Keyword(s):  
Chemical Sensing ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope
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