scholarly journals In situ absolute magnetometry in an UHV scanning probe microscope using conducting polymer-thin film

2017 ◽  
Vol 35 (2) ◽  
pp. 021602
Author(s):  
Kapildeb Ambal ◽  
Clayton C. Williams ◽  
Christoph Boehme
Keyword(s):  
Thin Film ◽  
Conducting Polymer ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Polymer Thin Film ◽  
Probe Microscope

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

scholarly journals Formation of double ring patterns on Co2MnSi Heusler alloy thin film by anodic oxidation under scanning probe microscope

AIP Advances ◽  
2013 ◽  
Vol 3 (2) ◽  
pp. 022124 ◽  
Author(s):  
Vijaykumar Toutam ◽  
Himanshu Pandey ◽  
Sandeep Singh ◽  
R. C. Budhani
Keyword(s):  
Thin Film ◽  
Anodic Oxidation ◽  
Heusler Alloy ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Alloy Thin Film ◽  
Double Ring ◽  
Probe Microscope

Formation and observation of 50 nm polarized domains in PbZr1−xTixO3 thin film using scanning probe microscope

1996 ◽  
Vol 68 (17) ◽  
pp. 2358-2359 ◽  
Author(s):  
T. Hidaka ◽  
T. Maruyama ◽  
M. Saitoh ◽  
N. Mikoshiba ◽  
M. Shimizu ◽  
...  
Keyword(s):  
Thin Film ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope
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