Scanning Probe Microscope Observation of Recorded Marks in Phase Change Disks

2001 ◽  
Vol 7 (4) ◽  
pp. 363-367
Author(s):  
Takashi Kikukawa ◽  
Hajime Utsunomiya
Keyword(s):  
Phase Change ◽  
Surface Potential ◽  
Detection Method ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
The Novel ◽  
Transmission Electron ◽  
Potential Mode ◽  
Probe Microscope ◽  
Conventional Transmission Electron Microscope

AbstractThis is the first report on observation of phase change recorded marks by use of the scanning probe microscope (SPM). The amorphous mark and crystalline blank were clearly observed by surface potential mode (SPoM) that visualized the surface potential difference among phases or materials. SPoM observation has an advantage over conventional transmission electron microscope (TEM) observation in that the sample preparation is much easier, and that amorphous mark and crystalline blank are clearly distinguished. The possibility of a novel readout method of phase change disks, and the possibility of the novel medium with a surface potential detection method are also proposed.

scholarly journals A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope

2016 ◽  
Vol 11 (6) ◽  
pp. 646-652
Author(s):  
Satoru Fujisawa ◽  
Hiroki Mano ◽  
Koji Miyake
Keyword(s):  
Acoustic Emission ◽  
Detection Method ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Observation of recording pits on phase-change film using a scanning probe microscope

2002 ◽  
Vol 91 (1-4) ◽  
pp. 119-126 ◽  
Author(s):  
Toshiya Nishimura ◽  
Masato Iyoki ◽  
Shoji Sadayama
Keyword(s):  
Phase Change ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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