scholarly journals Enhanced Electroluminescence from Silicon Quantum Dots Embedded in Silicon Nitride Thin Films Coupled with Gold Nanoparticles in Light Emitting Devices

Nanomaterials ◽  
2018 ◽  
Vol 8 (4) ◽  
pp. 182 ◽  
Author(s):  
Ana Muñoz-Rosas ◽  
Arturo Rodríguez-Gómez ◽  
Juan Alonso-Huitrón
2021 ◽  
Vol 323 ◽  
pp. 48-55
Author(s):  
Jia Xin Sun ◽  
Bing Qing Zhou ◽  
Xin Gu

Silicon-rich silicon nitride thin films are prepared on P-type monocrystalline silicon wafer (100) and glass substrate by plasma chemical vapor deposition with reaction gas sources SiH4 and NH3. The deposited samples are thermally annealed from 600°C to 1000°C in an atmosphere furnace filled with high purity nitrogen. The annealing time is 60 minutes. Fourier transform infrared spectroscopy (FTIR) is carried out to investigate the bonding configurations in the films. The results show that the Si-H bond and N-H bond decrease with the increase of annealing temperature, and completely disappear at the annealing temperature of 900°C. But the Si-N bond is enhanced with the increase of annealing temperature, and the blue shift occurs, then Si content in the film increases. The Raman Spectra show that the amorphous Si Raman peak appears at 480 cm-1 in the film at 700°C. The Raman spectra of the films annealed at 1000 °C is fitted with two peaks, and a peak at 497 cm -1 is found, which indicated that the Si phase in the films changed from amorphous to crystalline with the increase of annealing temperature. The experiment also analyses the luminescence properties of the samples through PL spectrum, and it is found that there are five luminescence peaks in each sample under different annealing temperature. Based on the analysis of Raman spectrum and FTIR spectrum, the PL peak of amorphous silicon quantum dots appears at the wavelength range of 525-555nm, and the other four PL peaks are all from the defect state luminescence in the thin films, and the amorphous silicon quantum dot size is calculated according to the formula.


2018 ◽  
Vol 208 ◽  
pp. 61-67 ◽  
Author(s):  
A. Rodríguez-Gómez ◽  
M. Moreno-Rios ◽  
R. García-García ◽  
A.L. Pérez-Martínez ◽  
J. Reyes-Gasga

RSC Advances ◽  
2016 ◽  
Vol 6 (81) ◽  
pp. 77440-77451 ◽  
Author(s):  
M. A. Serrano-Núñez ◽  
A. Rodríguez-Gómez ◽  
L. Escobar-Alarcón ◽  
J. C. Alonso-Huitrón

The photoluminescence (PL) evolution of SiQDs respect deposition and annealing temperatures is studied in a combined manner. The PL identified changes are associated to changes in thin film composition. 150 °C is identified as an important threshold.


2021 ◽  
Author(s):  
Sylwia Parzyszek ◽  
Damian Pociecha ◽  
Joanna Maria Wolska ◽  
Wiktor Lewandowski

Macroscopic scale sources of polarized light play a fundamental role in designing light-emitting devices. In this communication we report the formation of nano- and macro-scale ordered, layered assemblies of InP/ZnS...


2006 ◽  
Vol 12 (6) ◽  
pp. 1545-1555 ◽  
Author(s):  
Gun Yong Sung ◽  
Nae-Man Park ◽  
Jae-Heon Shin ◽  
Kyung-Hyun Kim ◽  
Tae-Youb Kim ◽  
...  

2017 ◽  
Vol 28 (28) ◽  
pp. 285202
Author(s):  
Jia Liu ◽  
Bin Liu ◽  
Xisheng Zhang ◽  
Xiaojia Guo ◽  
Shengzhong (Frank) Liu

2002 ◽  
Vol 16 (06n07) ◽  
pp. 1052-1056 ◽  
Author(s):  
TAO FENG ◽  
XI WANG ◽  
FU MIN ZHANG ◽  
SHI CHANG ZOU ◽  
WEI DONG HUANG ◽  
...  

We present a simple thin film encapsulation technique for organic light emitting devices (OLEDS), for use in flexible flat panel displays (FPDs). We systematically studied the moisture-resistant properties of silicon nitride thin films prepared by plasma-enhanced chemical vapor deposition (PECVD) and found that silicon nitride thin films have a low water vapor permeation (WVP) rate even deposited at low substrate temperature (20°C). Then OLEDs prototypes were successfully packaged by depositing silicon nitride thin films on them. Based on the analysis of the degradation of the OLEDs, we found the lifetime of the encapsulated devices was increased by more than two orders of magnitude over that of the unencapsulated ones. Our results demonstrated the feasibility of thin film packaging for OLEDs and the possibility to realize the flexible FPDs.


RSC Advances ◽  
2015 ◽  
Vol 5 (113) ◽  
pp. 92923-92931 ◽  
Author(s):  
A. L. Muñoz-Rosas ◽  
A. Rodríguez-Gómez ◽  
J. A. Arenas-Alatorre ◽  
J. C. Alonso-Huitrón

There is an optimum separation distance between light-emitting silicon quantum dots and a monolayer of nearly spherical gold nanoparticles to achieve a photoluminescence enhancement from the system.


Author(s):  
Chunxiu Zang ◽  
Mengxin Xu ◽  
Letian Zhang ◽  
Shihao Liu ◽  
Wenfa Xie

Thin film light-emitting devices (LEDs) with sandwich structure, such as organic light emitting devices (OLEDs), quantum dots LEDs (QLEDs) and perovskite LEDs (PeLEDs), have attracted wide attentions because of their...


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