Tomographic Study of Silicon Nanoparticles in Nanocrystalline Non-Volatile Flash Memory Devices by EFTEM

2012 ◽  
Author(s):  
YongKai Zhou ◽  
Jie Zhu ◽  
AnYan Du ◽  
YouNan Hua ◽  
ZhiQiang Mo ◽  
...  
Keyword(s):  
Flash Memory ◽  
Silicon Nanoparticles ◽  
Tomographic Reconstruction ◽  
Memory Devices ◽  
Plan View ◽  
Si Nanoparticle ◽  
Thin Film Layer ◽  
Si Nanoparticles ◽  
Key Factor ◽  
Film Layer

Abstract The distribution of Si nanoparticles, both dimensional and spatial, is a key factor affecting the performance of non-volatile flash memory devices. A new FIB method has been developed to prepare ultra-thin plan view specimens, containing only the Si nanoparticle matrix thin film layer, from fully processed nanocrystalline flash memory devices. The morphology and distribution of Si nanoparticles were then studied by EFTEM 3D tomographic reconstruction.

scholarly journals Study of Filtration in Polyethylene Fibers used in Masks for Protection Against SARS-CoV-2 via Luminescent Aerosolized Silicon Nanoparticles

2021 ◽  
Author(s):  
Ayman Rezk ◽  
Juveiriah Ashraf ◽  
Wafa Alnaqbi ◽  
Sabina Abdul Hadi ◽  
Ghada Dushaq ◽  
...  
Keyword(s):  
Silicon Nanoparticles ◽  
Optical Microscope ◽  
The Novel ◽  
Filtration Process ◽  
Fiber Network ◽  
Spider Web ◽  
Si Nanoparticle ◽  
Si Nanoparticles ◽  
Novel Coronavirus ◽  
Polyethylene Fibers

Abstract Commercial polyethylene (PE) fiber-based masks are currently used as personal filters for protection against various microorganisms. Due to the coronavirus (SARS-CoV-2) pandemic of 2020, the use of masks has become the critical mechanism in reducing the spread. The PE mask filter uses a sieve (geometry) in a spider web fashion to filter out microorganisms using Van der Waals atomic forces. However, the non-geometrical part of the filtration process is not fully understood. In this work, we utilized luminescent ultra-small silicon nanoparticles, which are Si-H or/and Si-OH terminated to examine how the filter operates at a chemical level. The particles were sprayed onto the fiber network by an atomizer and we used scanning electron microscopy (SEM), optical microscope and fluorescence spectroscopy under UV radiation. The images and measurements clearly showed that the Si nanoparticles bonded to the PE fiber network. The results were analyzed in terms of chemical bonding between Si nanoparticle and fiber. Our findings suggest that the PE fibers could act as a chemical filter via hydrogen or hydrolysis–based bonding or via Si-C bonding, which is complementary to their physical filtration ability via the geometric sieve process. Moreover, the results indicate that the filter would be effective against the novel coronavirus, not only by the geometrical sieve but can be additionally enhanced as a chemical filter by allowing the amine, carboxyl and hydroxyl function groups of the virus to attach to fibers via C-N and C-O bonds.

scholarly journals Optical Properties of Silicon Nanoparticles Prepared by Laser Ablation Method in Various Media

2014 ◽  
Vol 24 (3S1) ◽  
pp. 143-148
Author(s):  
Chu Anh Tuan ◽  
Nguyen Thi Thu Trang ◽  
Le Anh Tu ◽  
Duong Thi Giang ◽  
Pham Hong Duong ◽  
...  
Keyword(s):  
Optical Properties ◽  
Silicon Nanoparticles ◽  
Peak Position ◽  
Quenching Effect ◽  
Laser Ablation Method ◽  
Silicon Target ◽  
Si Nanoparticle ◽  
Si Nanoparticles ◽  
532 Nm ◽  
Si Wafer

Bright photoluminescent silicon nanoparticles were successfully fabricated from porous silicon target in air and n-hexane using 532 nm line of YAG:Nd pulsed laser. The whole procedure was carried out at room temperature, in atmosphere. The morphology and composition of as-synthesized nanoparticles were characterized by SEM and EDS measurements. Their optical properties were investigated. The PL peak position of the as-synthesized Si nanoparticle ablated in air is slightly blue-shifted in comparison with those ablated in n-hexane, while it was almost no change of peak position of Si nanoparticles fabricated from p-Si in hexane and original p-Si wafer target. In contrast to PL intensity quenching of original p-Si sample and particles produced in air, those produced in n-hexane solvent exhibited an enhancement. The presence of dangling bonds or energy transfer from excited Si particles to oxygen molecules on the surface can be the cause of the quenching effect.

Adaptive Interference Mitigation for Multilevel Flash Memory Devices

2011 ◽  
Vol E94-A (11) ◽  
pp. 2453-2457
Author(s):  
Myeongwoon JEON ◽  
Kyungchul KIM ◽  
Sungkyu CHUNG ◽  
Seungjae CHUNG ◽  
Beomju SHIN ◽  
...  
Keyword(s):  
Flash Memory ◽  
Interference Mitigation ◽  
Memory Devices

Characterization of tunnel-oxide degradation due to plasma field oxide recess in flash memory devices

2012 ◽  
Vol 520 (15) ◽  
pp. 5007-5010 ◽  
Author(s):  
Jeungyun Lee ◽  
Dong-Kwon Kim ◽  
Gyung-Jin Min ◽  
Ilsub Chung
Keyword(s):  
Flash Memory ◽  
Memory Devices ◽  
Oxide Degradation ◽  
Field Oxide

Measurements of Residual Stress in the Layers of Thin Film Micro-Gas Sensors

2000 ◽  
Vol 657 ◽  
Author(s):  
Youngman Kim ◽  
Sung-Ho Choo
Keyword(s):  
Thin Film ◽  
Mechanical Properties ◽  
Residual Stress ◽  
Gas Sensor ◽  
Gas Sensors ◽  
Micro Gas Sensor ◽  
Thin Film Layer ◽  
Film Layer ◽  
The Difference ◽  
Stress States

ABSTRACTThe mechanical properties of thin film materials are known to be different from those of bulk materials, which are generally overlooked in practice. The difference in mechanical properties can be misleading in the estimation of residual stress states in micro-gas sensors with multi-layer structures during manufacturing and in service.In this study the residual stress of each film layer in a micro-gas sensor was measured according to the five difference sets of film stacking structure used for the sensor. The Pt thin film layer was found to have the highest tensile residual stress, which may affect the reliability of the micro-gas sensor. For the Pt layer the changes in residual stress were measured as a function of processing variables and thermal cycling.

Garbage Collection Algorithms for NAND Flash Memory Devices -- An Overview

2013 ◽  
Author(s):  
Raja Subramani ◽  
Haritima Swapnil ◽  
Niharika Thakur ◽  
Bharath Radhakrishnan ◽  
Krishnamurthy Puttaiah
Keyword(s):  
Flash Memory ◽  
Garbage Collection ◽  
Memory Devices ◽  
Nand Flash ◽  
Nand Flash Memory
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