transmission electron microscopy specimen Latest Research Papers

Twin‐jet electropolishing for damage‐free transmission electron microscopy specimen preparation of metallic microwires

Microscopy Research and Technique ◽

10.1002/jemt.23588 ◽

2020 ◽

Author(s):

Saeid Pourbabak ◽

Andrey Orekhov ◽

Dominique Schryvers

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Specimen Preparation ◽

Transmission Electron Microscopy Specimen ◽

Transmission Electron

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Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach

Ultramicroscopy ◽

10.1016/j.ultramic.2018.12.001 ◽

2019 ◽

Vol 197 ◽

pp. 95-99 ◽

Cited By ~ 1

Author(s):

Lan-Hsuan Lee ◽

Chia-Hao Yu ◽

Chuan-Yu Wei ◽

Pei-Chin Lee ◽

Jih-Shang Huang ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Atomic Layer ◽

Specimen Preparation ◽

Transmission Electron Microscopy Specimen ◽

Plan View ◽

Transmission Electron

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Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method

Applied Microscopy ◽

10.9729/am.2018.48.4.122 ◽

2018 ◽

Vol 48 (4) ◽

pp. 122-125 ◽

Cited By ~ 2

Author(s):

Byeong-Seon An ◽

Yeon Ju Shin ◽

Jae-Seon Ju ◽

Cheol-Woong Yang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Protective Layer ◽

Specimen Preparation ◽

Two Dimensional ◽

Transmission Electron Microscopy Specimen ◽

Transmission Electron ◽

Beam Method

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Transmission Electron Microscopy Specimen Preparation of Delicate Materials Using Tripod Polisher

Applied Microscopy ◽

10.9729/am.2016.46.2.110 ◽

2016 ◽

Vol 46 (2) ◽

pp. 110-115 ◽

Cited By ~ 3

Author(s):

Hyun-Woo Cha ◽

Min-Chul Kang ◽

Keesam Shin ◽

Cheol-Woong Yang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Specimen Preparation ◽

Transmission Electron Microscopy Specimen ◽

Transmission Electron

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Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling

Applied Microscopy ◽

10.9729/am.2015.45.4.189 ◽

2015 ◽

Vol 45 (4) ◽

pp. 189-194 ◽

Cited By ~ 3

Author(s):

Jung Ho Yoo ◽

Jun-Mo Yang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Specimen Preparation ◽

Preparation Technique ◽

Transmission Electron Microscopy Specimen ◽

Ion Milling ◽

Cross Sectional ◽

Transmission Electron

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Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer on Silicon Substrate Using the Focused Ion Beam with Gas-Assisted Etch

Applied Microscopy ◽

10.9729/am.2015.45.4.195 ◽

2015 ◽

Vol 45 (4) ◽

pp. 195-198 ◽

Cited By ~ 2

Author(s):

Ji-Soo Kim ◽

Sang-Yeol Nam ◽

Young-Hwan Choi ◽

Ju-Cheol Park

Keyword(s):

Thin Film ◽

Focused Ion Beam ◽

Preparation Method ◽

Ion Beam ◽

Transmission Electron Microscopy Specimen ◽

Plan View ◽

Transmission Electron ◽

Thin Film Layer ◽

Film Layer ◽

Cu Thin Film

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Strategies for transmission electron microscopy specimen preparation of polymer composites

10.6028/nist.sp.1200-16 ◽

2015 ◽

Author(s):

Keana C. Scott ◽

Lucille A. Giannuzzi

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Polymer Composites ◽

Specimen Preparation ◽

Transmission Electron Microscopy Specimen ◽

Transmission Electron

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Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method

Applied Microscopy ◽

10.9729/am.2014.44.4.133 ◽

2014 ◽

Vol 44 (4) ◽

pp. 133-137 ◽

Cited By ~ 1

Author(s):

Youngji Cho ◽

Jun-Mo Yang ◽

Do Van Lam ◽

Seung-Mo Lee ◽

Jae-Hyun Kim ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Specimen Preparation ◽

Direct Transfer ◽

Transmission Electron Microscopy Specimen ◽

Transmission Electron ◽

Transfer Method

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Cu out-diffusion in kesterites—A transmission electron microscopy specimen preparation artifact

Applied Physics Letters ◽

10.1063/1.4790282 ◽

2013 ◽

Vol 102 (5) ◽

pp. 051902 ◽

Cited By ~ 19

Author(s):

J. Timo Wätjen ◽

Jonathan J. Scragg ◽

Marika Edoff ◽

Stefano Rubino ◽

Charlotte Platzer-Björkman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Specimen Preparation ◽

Transmission Electron Microscopy Specimen ◽

Transmission Electron

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Degradation of a Thin Ag Layer Induced by Poly(3,4-ethylenedioxythiophene):Polystyrene Sulfonate in a Transmission Electron Microscopy Specimen of an Inverted Polymer Solar Cell

ACS Applied Materials & Interfaces ◽

10.1021/am301818z ◽

2012 ◽

Vol 4 (10) ◽

pp. 5118-5124 ◽

Cited By ~ 37

Author(s):

Youngjoon Suh ◽

Ning Lu ◽

Sang H. Lee ◽

Won-Suk Chung ◽

Kyungkon Kim ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Solar Cell ◽

Polymer Solar Cell ◽

Transmission Electron Microscopy Specimen ◽

Polystyrene Sulfonate ◽

Transmission Electron ◽

Inverted Polymer Solar Cell

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transmission electron microscopy specimen
Recently Published Documents

TOTAL DOCUMENTS

H-INDEX

Twin‐jet electropolishing for damage‐free transmission electron microscopy specimen preparation of metallic microwires

Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach

Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method

Transmission Electron Microscopy Specimen Preparation of Delicate Materials Using Tripod Polisher

Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling

Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer on Silicon Substrate Using the Focused Ion Beam with Gas-Assisted Etch

Strategies for transmission electron microscopy specimen preparation of polymer composites

Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method

Cu out-diffusion in kesterites—A transmission electron microscopy specimen preparation artifact

Degradation of a Thin Ag Layer Induced by Poly(3,4-ethylenedioxythiophene):Polystyrene Sulfonate in a Transmission Electron Microscopy Specimen of an Inverted Polymer Solar Cell

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transmission electron microscopy specimenRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

Twin‐jet electropolishing for damage‐free transmission electron microscopy specimen preparation of metallic microwires

Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach

Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method

Transmission Electron Microscopy Specimen Preparation of Delicate Materials Using Tripod Polisher

Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling

Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer on Silicon Substrate Using the Focused Ion Beam with Gas-Assisted Etch

Strategies for transmission electron microscopy specimen preparation of polymer composites

Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method

Cu out-diffusion in kesterites—A transmission electron microscopy specimen preparation artifact

Degradation of a Thin Ag Layer Induced by Poly(3,4-ethylenedioxythiophene):Polystyrene Sulfonate in a Transmission Electron Microscopy Specimen of an Inverted Polymer Solar Cell

transmission electron microscopy specimen
Recently Published Documents