A Hybrid Multi-gate Model of a Gallium Nitride (GaN) High Electron Mobility Transistor (HEMT) Device Incorporating GaN-substrate Thermal Boundary Resistance
2010 ◽
Vol 4
(1)
◽
pp. 171-179
◽
2019 ◽
Vol 14
(7)
◽
pp. 1091-1094