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Kewal K. SALUJA ◽  
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scholarly journals Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations

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Xrysovalantis Kavousianos ◽  
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Emmanouil Kalligeros ◽  
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A Combining FPE and Additional Test Vectors Hybrid Strategy for IPMSM Sensorless Control

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Vol 33 (7) ◽  
pp. 6104-6113 ◽  
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Qipeng Tang ◽  
Anwen Shen ◽  
Hanlin Shen ◽  
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Keyword(s):  
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Additional Test ◽  
Hybrid Strategy ◽  
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