Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults

2008 ◽  
Author(s):  
Yoshinobu Higami ◽  
Kewal K. Saluja ◽  
Hiroshi Takahashi ◽  
Shin-ya Kobayashi ◽  
Yuzo Takamatsu
Keyword(s):  
Defect Coverage ◽  
Open Faults ◽  
Test Vectors

Addressing Defect Coverage through Generating Test Vectors for Transistor Defects

2009 ◽  
Vol E92-A (12) ◽  
pp. 3128-3135
Author(s):  
Yoshinobu HIGAMI ◽  
Kewal K. SALUJA ◽  
Hiroshi TAKAHASHI ◽  
Shin-ya KOBAYASHI ◽  
Yuzo TAKAMATSU
Keyword(s):  
Defect Coverage ◽  
Test Vectors

Fault Isolation of Open Defects Using Space Domain Reflectometry

2012 ◽  
Author(s):  
Mayue Xie ◽  
Zhiguo Qian ◽  
Mario Pacheco ◽  
Zhiyong Wang ◽  
Rajen Dias ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Fault Isolation ◽  
Nondestructive Technique ◽  
Space Domain ◽  
New Approach ◽  
Defect Localization ◽  
Open Faults ◽  
Open Defects ◽  
Application Optimization ◽  
Rf Magnetic Field

Abstract Recently, a new approach for isolation of open faults in integrated circuits (ICs) was developed. It is based on mapping the radio-frequency (RF) magnetic field produced by the defective part fed with RF probing current, giving the name to Space Domain Reflectometry (SDR). SDR is a non-contact and nondestructive technique to localize open defects in package substrates, interconnections and semiconductor devices. It provides 2D failure isolation capability with defect localization resolution down to 50 microns. It is also capable of scanning long traces in Si. This paper describes the principles of the SDR and its application for the localization of open and high resistance defects. It then discusses some analysis methods for application optimization, and gives examples of test samples as well as case studies from actual failures.

Modifying Slots in Test Vectors to Validate Decoders of a Train Network

2006 ◽  
Author(s):  
Jaime Jimenez ◽  
Iker Hoyos ◽  
Jagoba Arias ◽  
Armando Astorlao ◽  
Jose L. Martin
Keyword(s):  
Test Vectors

scholarly journals Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations

2020 ◽  
Vol 25 (5) ◽  
pp. 1-27
Author(s):  
Nektar Xama ◽  
Martin Andraud ◽  
Jhon Gomez ◽  
Baris Esen ◽  
Wim Dobbelaere ◽  
...  
Keyword(s):  
Machine Learning ◽  
Analog Circuits ◽  
Defect Coverage

scholarly journals Defect Coverage-Driven Window-Based Test Compression

2010 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Krishnendu Chakrabarty ◽  
Emmanouil Kalligeros ◽  
Vasileios Tenentes
Keyword(s):  
Defect Coverage ◽  
Test Compression
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