scholarly journals Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume

2009 ◽  
Vol 6 (20) ◽  
pp. 1432-1437 ◽  
Author(s):  
Yongjoon Kim ◽  
Jaeseok Park ◽  
Sungho Kang
Keyword(s):  
Power Consumption ◽  
Test Data ◽  
Test Power ◽  
Simultaneous Reduction ◽  
Data Volume

A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction

2008 ◽  
Vol 24 (4) ◽  
pp. 353-364 ◽  
Author(s):  
N. Badereddine ◽  
Z. Wang ◽  
P. Girard ◽  
K. Chakrabarty ◽  
A. Virazel ◽  
...  
Keyword(s):  
Test Data ◽  
Power Reduction ◽  
Test Power ◽  
Data Volume ◽  
Test Power Reduction

Reducing test-data volume and test-power simultaneously in LFSR reseeding-based compression environment

2011 ◽  
Vol 32 (7) ◽  
pp. 075009 ◽  
Author(s):  
Weizheng Wang ◽  
Jishun Kuang ◽  
Zhiqiang You ◽  
Peng Liu
Keyword(s):  
Test Data ◽  
Test Power ◽  
Data Volume ◽  
Lfsr Reseeding

Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction

2007 ◽  
Vol 56 (4) ◽  
pp. 557-562 ◽  
Author(s):  
Dong Xiang ◽  
Kaiwei Li ◽  
Jiaguang Sun ◽  
Hideo Fujiwara
Keyword(s):  
Test Data ◽  
Power Reduction ◽  
Test Power ◽  
Test Application ◽  
Data Volume ◽  
Test Power Reduction
Sign in / Sign up

Export Citation Format

Share Document