13th Asian Test Symposium
Latest Publications

TOTAL DOCUMENTS

89

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By IEEE

0769522351

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction

13th Asian Test Symposium ◽

10.1109/ats.2004.80 ◽

2005 ◽

Author(s):

Y. Higami ◽

S. Kajihara ◽

S.-y. Kobayashi ◽

Y. Takamatsu

Keyword(s):

Power Reduction ◽

Sequential Circuits ◽

Test Length

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Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity

13th Asian Test Symposium ◽

10.1109/ats.2004.57 ◽

2005 ◽

Cited By ~ 3

Author(s):

D.K. Das ◽

T. Inoue ◽

S. Chakraborty ◽

H. Fujiwara

Keyword(s):

Test Generation ◽

Sequential Circuits

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March Based Memory Core Test Scheduling for SOC

13th Asian Test Symposium ◽

10.1109/ats.2004.56 ◽

2005 ◽

Cited By ~ 1

Author(s):

Wei-Lun Wang

Keyword(s):

Test Scheduling

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Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing

13th Asian Test Symposium ◽

10.1109/ats.2004.47 ◽

2005 ◽

Author(s):

Ho Fai Ko ◽

N. Nicolici

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Scan Chain ◽

Scan Chain Design

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Pair Balance-Based Test Scheduling for SOCs

13th Asian Test Symposium ◽

10.1109/ats.2004.67 ◽

2005 ◽

Cited By ~ 2

Author(s):

Yu Hu ◽

Yin-He Han ◽

Hua-Wei Li ◽

Tao Lv ◽

Xiao-Wei Li

Keyword(s):

Test Scheduling

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A Low-Cost Diagnosis Methodology for Pipelined A/D Converters

13th Asian Test Symposium ◽

10.1109/ats.2004.8 ◽

2005 ◽

Cited By ~ 3

Author(s):

Chih-Haur Huang ◽

Kuen-Jong Lee ◽

Soon-Jyh Chang

Keyword(s):

Low Cost

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Full Restoration of Multiple Faults in WDM Networks without Wavelength Conversion

13th Asian Test Symposium ◽

10.1109/ats.2004.46 ◽

2005 ◽

Author(s):

Chuan-Ching Sue ◽

Jun-Ying Yeh ◽

Chin-Yu Huang

Keyword(s):

Wavelength Conversion ◽

Wdm Networks ◽

Multiple Faults

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Considering Fault Dependency and Debugging Time Lag in Reliability Growth Modeling during Software Testing

13th Asian Test Symposium ◽

10.1109/ats.2004.33 ◽

2005 ◽

Cited By ~ 2

Author(s):

Chin-Yu Huang ◽

Chu-Ti Lin ◽

Chuan-Ching Sue

Keyword(s):

Software Testing ◽

Time Lag ◽

Growth Modeling ◽

Reliability Growth ◽

Fault Dependency

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Scan Chain Fault Identification Using Weight-Based Codes for SoC Circuits

13th Asian Test Symposium ◽

10.1109/ats.2004.77 ◽

2005 ◽

Cited By ~ 6

Author(s):

S. Ghosh ◽

K.W. Lai ◽

W.B. Jone ◽

S.C. Chang

Keyword(s):

Fault Identification ◽

Scan Chain

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Efficient Template Generation for Instruction-Based Self-Test of Processor Cores

13th Asian Test Symposium ◽

10.1109/ats.2004.39 ◽

2005 ◽

Cited By ~ 8

Author(s):

K. Kambe ◽

M. Inoue ◽

H. Fujiwara

Keyword(s):

Self Test ◽

Processor Cores

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