Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction

Dong Xiang; Kaiwei Li; Jiaguang Sun; Hideo Fujiwara

doi:10.1109/tc.2007.1002

Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction

IEEE Transactions on Computers ◽

10.1109/tc.2007.1002 ◽

2007 ◽

Vol 56 (4) ◽

pp. 557-562 ◽

Cited By ~ 45

Author(s):

Dong Xiang ◽

Kaiwei Li ◽

Jiaguang Sun ◽

Hideo Fujiwara

Keyword(s):

Test Data ◽

Power Reduction ◽

Test Power ◽

Test Application ◽

Data Volume ◽

Test Power Reduction

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A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction

Journal of Electronic Testing ◽

10.1007/s10836-007-5053-z ◽

2008 ◽

Vol 24 (4) ◽

pp. 353-364 ◽

Cited By ~ 12

Author(s):

N. Badereddine ◽

Z. Wang ◽

P. Girard ◽

K. Chakrabarty ◽

A. Virazel ◽

...

Keyword(s):

Test Data ◽

Power Reduction ◽

Test Power ◽

Data Volume ◽

Test Power Reduction

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Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.70 ◽

2010 ◽

Cited By ~ 1

Author(s):

Zhiqiang You ◽

Jiedi Huang ◽

Michiko Inoue ◽

Jishun Kuang ◽

Hideo Fujiwara

Keyword(s):

Test Data ◽

Application Time ◽

Test Power ◽

Test Application Time ◽

Test Application ◽

Data Volume

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Reducing test application time, test data volume and test power through Virtual Chain Partition

Integration ◽

10.1016/j.vlsi.2008.12.001 ◽

2009 ◽

Vol 42 (3) ◽

pp. 385-399 ◽

Cited By ~ 4

Author(s):

José M. Solana

Keyword(s):

Test Data ◽

Application Time ◽

Test Power ◽

Test Application Time ◽

Test Application ◽

Data Volume ◽

Time Test ◽

Chain Partition

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Test power reduction and test pattern generation for multiple faults using zero suppressed decision diagrams

International Journal of High Performance Systems Architecture ◽

10.1504/ijhpsa.2016.076204 ◽

2016 ◽

Vol 6 (1) ◽

pp. 51 ◽

Cited By ~ 3

Author(s):

J.P. Anita ◽

P. Sudheesh

Keyword(s):

Test Pattern ◽

Power Reduction ◽

Pattern Generation ◽

Test Pattern Generation ◽

Decision Diagrams ◽

Test Power ◽

Multiple Faults ◽

Test Power Reduction

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Multiple Fault Diagnosis and Test Power Reduction Using Genetic Algorithms

Eco-friendly Computing and Communication Systems - Communications in Computer and Information Science ◽

10.1007/978-3-642-32112-2_11 ◽

2012 ◽

pp. 84-92 ◽

Cited By ~ 2

Author(s):

J. P. Anita ◽

P. T. Vanathi

Keyword(s):

Genetic Algorithms ◽

Fault Diagnosis ◽

Power Reduction ◽

Test Power ◽

Multiple Fault ◽

Multiple Fault Diagnosis ◽

Test Power Reduction

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Fault Diagnosis Using Automatic Test Pattern Generation and Test Power Reduction Technique for VLSI Circuits

2019 3rd International Conference on Trends in Electronics and Informatics (ICOEI) ◽

10.1109/icoei.2019.8862751 ◽

2019 ◽

Author(s):

Ch. Narasimha Kumar ◽

A. Madhumitha ◽

N. Sesi Preetam ◽

P. Vamsi Gupta ◽

J.P. Anita

Keyword(s):

Fault Diagnosis ◽

Test Pattern ◽

Power Reduction ◽

Pattern Generation ◽

Reduction Technique ◽

Vlsi Circuits ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Test Power ◽

Test Power Reduction

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Circuit Design Methodologies for Test Power Reduction in Nano-Scaled Technologies

Lecture Notes in Electrical Engineering - Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013) ◽

10.1007/978-81-322-1524-0_20 ◽

2013 ◽

pp. 139-149

Author(s):

Veena S. Chakravarthi ◽

Swaroop Ghosh

Keyword(s):

Circuit Design ◽

Power Reduction ◽

Test Power ◽

Design Methodologies ◽

Test Power Reduction

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A routability constrained scan chain ordering technique for test power reduction

Asia and South Pacific Conference on Design Automation, 2006. ◽

10.1145/1118299.1118453 ◽

2006 ◽

Cited By ~ 1

Author(s):

X.-L. Huang ◽

J.-L. Huang

Keyword(s):

Power Reduction ◽

Test Power ◽

Test Power Reduction ◽

Scan Chain ◽

Chain Ordering

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Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

IEICE Transactions on Information and Systems ◽

10.1587/transinf.e92.d.1462 ◽

2009 ◽

Vol E92-D (7) ◽

pp. 1462-1465 ◽

Cited By ~ 2

Author(s):

Yongjoon KIM ◽

Myung-Hoon YANG ◽

Jaeseok PARK ◽

Eunsei PARK ◽

Sungho KANG

Keyword(s):

Test Data ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume

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Genetic Algorithm based Scan Chain Optimization and Test Power Reduction using Physical Information

TENCON 2006 - 2006 IEEE Region 10 Conference ◽

10.1109/tencon.2006.344008 ◽

2006 ◽

Cited By ~ 4

Author(s):

Barun Bikash Paul ◽

Rajdeep Mukhopadhyay ◽

Indranil Sen Gupta

Keyword(s):

Genetic Algorithm ◽

Power Reduction ◽

Test Power ◽

Physical Information ◽

Test Power Reduction ◽

Scan Chain

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