High-Spatial-Resolution Diffusion Length Measurements in Polycrystalline GaAs

1981 ◽  
Vol 5 ◽  
Author(s):  
Robert M. Fletcher ◽  
D. Ken Wagner ◽  
G. W. Wicks ◽  
J. M. Ballantyne
Keyword(s):  
Nondestructive Evaluation ◽  
Spatial Resolution ◽  
Minority Carrier ◽  
Diffusion Length ◽  
High Spatial Resolution ◽  
Small Step ◽  
Large Area ◽  
Minority Carrier Diffusion Length ◽  
Length Measurements

ABSTRACTA technique for making rapidly-scanned, high-spatial resolution measurements of minority-carrier diffusion length is applied to the characterization of polycrystalline GaAs. Measurements on a large-grained n-type epitaxial layer show gradual variations of hole diffusion length from 0.1µm to l.lµm across the wafer as well as occasional small step changes at grain boundaries. By trading resolution for speed, the technique would be well suited to the nondestructive evaluation of large-area epitaxial layers.

Design and Characterization of a Real Time, Large Area, High Spatial Resolution Particle Tracker Based on Scintillating Fibers

2013 ◽  
pp. 159-174 ◽  
Author(s):  
D. Lo Presti ◽  
D. L. Bonanno ◽  
F. Longhitano ◽  
C. Pugliatti ◽  
S. Aiello ◽  
...  
Keyword(s):  
Real Time ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Large Area ◽  
Scintillating Fibers

scholarly journals Minority carrier diffusion length measurements in 6H–SiC

2005 ◽  
Vol 97 (5) ◽  
pp. 053703 ◽  
Author(s):  
Alexander Y. Polyakov ◽  
Qiang Li ◽  
Sung Wook Huh ◽  
Marek Skowronski ◽  
Olena Lopatiuk ◽  
...  
Keyword(s):  
Minority Carrier ◽  
Diffusion Length ◽  
Minority Carrier Diffusion Length ◽  
Carrier Diffusion ◽  
Length Measurements
Sign in / Sign up

Export Citation Format

Share Document