Recombination Lifetime Measurements in Silicon
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Published By ASTM International

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The Application of Minority Carrier Lifetime Techniques in Modern CZ Silicon

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15708s ◽

2009 ◽

pp. 226-226-24 ◽

Cited By ~ 6

Author(s):

R Falster ◽

G Borionetti

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime

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Monitoring of Surface Minority Carrier Lifetime Using Modulated Photocurrent

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15702s ◽

2009 ◽

pp. 156-156-12

Author(s):

S Liberman

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime

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Present Status of the Surface Photovoltage Method (SPV) for Measuring Minority Carrier Diffusion Length and Related Parameters

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15700s ◽

2009 ◽

pp. 125-125-20 ◽

Cited By ~ 2

Author(s):

J Lagowski ◽

P Edelman ◽

V Faifer

Keyword(s):

Present Status ◽

Minority Carrier ◽

Diffusion Length ◽

Surface Photovoltage ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion

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Optimization and Control of Elymat Lifetime Measurement for Use in a Manufacturing Setting

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15699s ◽

2009 ◽

pp. 112-112-11 ◽

Cited By ~ 1

Author(s):

GA Keefe ◽

WM Hughes

Keyword(s):

Lifetime Measurement ◽

Optimization And Control ◽

And Control

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Carrier Lifetime Measurements by Microwave Photoconductivity Decay Method

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15693s ◽

2009 ◽

pp. 47-47-12 ◽

Cited By ~ 6

Author(s):

H Hashizume ◽

S Sumie ◽

Y Nakai

Keyword(s):

Carrier Lifetime ◽

Lifetime Measurements ◽

Photoconductivity Decay

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Appendix I: Panel Discussions

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15719s ◽

2009 ◽

pp. 381-381-5

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Influence of Iron and Copper on Minority Carrier Recombination Lifetime in Silicon

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15710s ◽

2009 ◽

pp. 259-259-9 ◽

Cited By ~ 4

Author(s):

A Kempf ◽

P Blöchl ◽

A Huber ◽

F Fabry ◽

L Meinecke

Keyword(s):

Minority Carrier ◽

Recombination Lifetime ◽

Carrier Recombination

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Canalysis of Photoconductance Decay and Surface Photovoltage Techniques: Theoretical Perspective and Experimental Evidence

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15704s ◽

2009 ◽

pp. 185-185-14

Author(s):

A Buczkowski

Keyword(s):

Experimental Evidence ◽

Theoretical Perspective ◽

Surface Photovoltage

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Effects of Sample Inhomogeneity and Geometry on Photoconductivity Decay

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15697s ◽

2009 ◽

pp. 88-88-11 ◽

Cited By ~ 1

Author(s):

T Wang ◽

TF Ciszek

Keyword(s):

Photoconductivity Decay

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Recombination Lifetimes in Silicon

Recombination Lifetime Measurements in Silicon ◽

10.1520/stp15690s ◽

2009 ◽

pp. 5-5-13

Author(s):

DK Schroder

Keyword(s):

Recombination Lifetimes

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