Persistent Photoconductivity in n-Type GaN

1996 ◽  
Vol 449 ◽  
Author(s):  
A. E. Wickenden ◽  
G. Beadie ◽  
D. D. Koleske ◽  
W. S. Rabinovich ◽  
J. A. Freitas

ABSTRACTPersistent photoconductivity has been observed in n-type Si-doped GaN grown on sapphire substrates by metalorganic vapor phase epitaxy. The effect has been seen both in films which are of electrically high quality, based on low temperature photoluminescence (PL) and Hall analysis, and in films which either appear to be compensated or which exhibit strong donor-acceptor pair recombination. The photoconductivity has been observed to persist for several days at room temperature (300K). Modeling of the resistance recovery by a stretched exponential treatment may suggest a distribution of deep level defect centers in the Si-doped GaN films.

2002 ◽  
Vol 743 ◽  
Author(s):  
Bing Han ◽  
Joel M. Gregie ◽  
Melville P. Ulmer ◽  
Bruce W. Wessels

ABSTRACTDeep level defects formed in p-type GaN:Mg codoped with shallow donors have been investigated by photoluminescence (PL) spectroscopy. A donor-acceptor pair (DAP) luminescence band peaked at 2.45 eV dominates the room temperature PL spectrum in heavily codoped epilayers. A superlinear dependence of PL intensity on excitation density is observed for this band, with an exponent of 1.4∼1.7. The intensity of this band increases with increasing temperature with a maximum at 264K. To explain the luminescent behavior a DAP model was developed whereby the recombination involves a deep donor and shallow Mg acceptor. The deep donor is tentatively attributed to a DX center.


1998 ◽  
Vol 84 (4) ◽  
pp. 2082-2085 ◽  
Author(s):  
T. W. Kang ◽  
S. H. Park ◽  
H. Song ◽  
T. W. Kim ◽  
G. S. Yoon ◽  
...  

1989 ◽  
Vol 160 ◽  
Author(s):  
Y. Okano ◽  
H. Seto ◽  
M. Shigeta ◽  
S. Nishine ◽  
I. Fujimoto ◽  
...  

AbstractThe MBE growth of Si doped GaAs on slightly misoriented (111)A substrates was examined. The conduction types and the carrier concentrations were greatly affected by the degree of substrate misorientation. In the growth on an exactly (111)A oriented substrate, substantially all Si atoms acted as acceptors. With increase of the degree of misorientation and/or with increase of the flux ratio (JAs4/JGa), the number of donor-site Si atoms increased, that is, the hole concentration first decreased by autocompensation of Si and then the conductivity reversed from p-type to n-type. The photoluminescence of highly compensated (111)A films showed characteristics of donor-acceptor pair recombination. A doping mechanism including preferential decomposition of As4 molecules at the steps was proposed.


2005 ◽  
Vol 892 ◽  
Author(s):  
Michael A. Reshchikov ◽  
Xing Gu ◽  
Bill Nemeth ◽  
Jeff Nause ◽  
Hadis Morkoç

AbstractThe quantum efficiency (QE) of photoluminescence (PL) has been estimated in GaN and ZnO samples. A Si-doped GaN layer grown by molecular beam epitaxy (MBE) exhibited the highest QE of about 90% at low temperatures. Recombination via the shallow donor-acceptor pair transitions dominated in this sample. In contrast, a bulk ZnO crystal with the QE of PL of about 85% contained almost no defect- or impurity-related PL signatures besides the emission attributed to free and bound excitons. The sources of radiative and nonradiative recombination in GaN and ZnO are discussed.


1995 ◽  
Vol 378 ◽  
Author(s):  
B. K. Meyer ◽  
D. Volm ◽  
C. Wetzel ◽  
L. Eckey ◽  
J.-Ch. Holst ◽  
...  

AbstractFree and bound exciton luminescences as well as donor-acceptor pair recombination of GaN epitaxial layers on 6H-SiC and sapphire substrates were investigated using time integrated and time resolved photoluminescence measurements at low temperatures. Lifetimes are determined for the donor bound exciton at 3.4722eV and for two acceptor bound excitons with energies of 3.4672eV and 3.459eV. Luminescences between 3.29eV and 3.37eV are identified as due to excitons deeply bound to centers located near the substrate-epilayer interface.


1996 ◽  
Vol 450 ◽  
Author(s):  
Yurri V. Rud ◽  
Vasilii Yu ◽  
M. C. Ohmer ◽  
P. G. Shunemann

ABSTRACTPhotoluminescence (PL) steady-state spectra of p-ZnGeP2 (ZGP) single crystals grown by high- and low-temperature directed crystallization have been investigated. It is determined that the long-wavelength component PL with a maximum in the interval 1.2–1.5 eV for different crystals quenched in the temperature range 77–300 K. The long-wavelength component PL are due to donor-acceptor pair transitions. At room temperature the short-wavelength PL with a maximum near 1.85 eV becomes the determining component. The nature of this band discussed. The use of low-temperature directed crystallization reduces the concentration of lattice defects in ZGP single crystals and opens up the new possibilities for increasing the conversion efficiencies of nonlinear devices.


2007 ◽  
Vol 1012 ◽  
Author(s):  
Thomas Kirchartz ◽  
Julian Mattheis ◽  
Uwe Rau

AbstractWe compare the electroluminescence (EL) of three polycrystalline ZnO/CdS/Cu(In,Ga)Se2 heterojunction solar cells with similar bandgaps but different open circuit voltages, indicating a difference in the electronic quality of the absorber. Temperature dependent electroluminescence measurements reveal that all cells feature transitions from donor-acceptor pair recombination at lower temperatures to band to band recombination at higher temperatures. However, the less efficient cells show a longer transition range with donor-acceptor pair recombination still apparent at room temperature. The thus broadened room temperature luminescence is one effect which reduces the open circuit voltage of the devices below the Shockley-Queisser-limit. The other effect is the existence of non-radiative recombination currents, which determine the efficiency of the device as light emitting diode. To quantify the open circuit voltage losses, we use reciprocity relations between electroluminescent and photovoltaic action of solar cells, which allow us to predict the light emitting diode efficiency. Measurements support the theory and show that Cu(In,Ga)Se2 solar cells reach external LED efficiencies approaching.


1989 ◽  
Vol 162 ◽  
Author(s):  
J. A. Freitas ◽  
S. G. Bishop

ABSTRACTThe temperature and excitation intensity dependence of photoluminescence (PL) spectra have been studied in thin films of SiC grown by chemical vapor deposition on Si (100) substrates. The low power PL spectra from all samples exhibited a donor-acceptor pair PL band which involves a previously undetected deep acceptor whose binding energy is approximately 470 meV. This deep acceptor is found in every sample studied independent of growth reactor, suggesting the possibility that this background acceptor is at least partially responsible for the high compensation observed in Hall effect studies of undoped films of cubic SiC.


Author(s):  
R. Freitag ◽  
K. Thonke ◽  
R. Sauer ◽  
D. G. Ebling ◽  
L. Steinke

We report on the time-resolved luminescence of the defect-related violet band from undoped AlN epitaxial layers grown on sapphire and SiC. For both measurements in photoluminescence and in cathodoluminescence a decay of algebraic nature at long times is observed. This is typical for donor-acceptor pair transitions. We compare the behavior of this band to that of the generically yellow luminescence of GaN.


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