Delayed Field Transient Photocurrent Measurements in a-Si:H
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ABSTRACTWe have measured the transient photocurrent in “time-of-flight” structures of a-Si:H using bias voltages applied following photocarrier generation by a laser flash. The delayed field technique appears promising both as a probe of the deep level distribution and also of photocarrier thermalization. We describe a simplified theory for the delayed field transients including the effects of the delay time and the magnitude of the applied voltage. The theory accounts for the measurements adequately.
1993 ◽
Vol 11
(5)
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pp. 2603-2609
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2016 ◽
Vol 34
(3)
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pp. 552-561
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2002 ◽
Vol 216
(1)
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pp. 75-83
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1987 ◽
Vol 26
(Part 1, No. 3)
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pp. 377-382
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