GexSi1−x Waveguides Grown by Rapid Thermal Processing Chemical Vator Deposition
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ABSTRACTWe report the growth and characterization of GexSi1−x films for optical waveguiding. GexSi1−x/Si waveguides were grown by rapid thermal processing chemical vapor deposition. An average attenuation of 3.3 dB/cm was achieved for a 1 μm thick Ge0.04Si0.96 layer patterned into rib waveguides 2000 Å deep with widths of 5 μm. Directional couplers were also fabricated. Average coupling efficiencies of 85% were achieved for 1.5 μm interwaveguide separation.
1997 ◽
Vol 44
(9)
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pp. 1417-1424
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1991 ◽
Vol 138
(4)
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pp. 1188-1207
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