Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects

2017 ◽  
pp. 147-160
Author(s):  
K. Goel Sandeep ◽  
Devta-Prasanna Narendra
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects

Circuit Topology-Based Test Pattern Generation for Small-Delay Defects

2010 ◽  
Author(s):  
Sandeep Kumar Goel ◽  
Krishnendu Chakrabarty ◽  
Mahmut Yilmaz ◽  
Ke Peng ◽  
Mohammad Tehranipoor
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Circuit Topology ◽  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects

Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults

2013 ◽  
Vol 29 (1) ◽  
pp. 35-48 ◽  
Author(s):  
Fang Bao ◽  
Ke Peng ◽  
Mahmut Yilmaz ◽  
Krishnendu Chakrabarty ◽  
LeRoy Winemberg ◽  
...  
Keyword(s):  
Pattern Generation ◽  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects ◽  
Selection Of

scholarly journals Improving Quality of Manufacturing Test using Cell-Aware ATPG

2021 ◽  
Vol 23 (06) ◽  
pp. 1055-1060
Author(s):  
Pampapathi Yanna ◽  
◽  
Dr. Nithin M ◽  
Jeetpal Singh Chhabra ◽  
◽  
...  
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Fault Models ◽  
Test Quality ◽  
Small Delay ◽  
Manufacturing Test ◽  
A Cell ◽  
Test Escapes

The existing fault models like stuck-at, small delay defect, transition, and bridge fault models and their associated patterns are becoming less efficient, as the technology moves to increasingly smaller geometries. It is because traditional defect models target the faults only on IC gate boundaries, and the interconnects between the cells, but a significant population of defects (perhaps up to 50%) occurs within the cells or gates which are not specifically targeted by existing ATPG fault models. In this paper, a new ATPG methodology known as the Cell-aware test is implemented explicitly to target the defects caused by cell-internal open and short faults and improve the manufacturing test quality by minimizing the test escapes. This work explains how a Cell-Aware ATPG method performs a characterization on the GDSII data of library cell`s to produce a CAT library view (UDFM), test Pattern generation, and comparison between Traditional and Cell-Aware ATPG. The Cell-Aware ATPG is implemented using Tessent Testkompress, traditional ATPG is also developed to study and analyze both ATPG methodologies comparatively. Experiment results show a significant improvement in faults being targeted at an expense of an increase in pattern count and run-time. Obtained 71.28% and 59.38% test coverage for UDFM static and UDFM delay respectively. Achieved significant improvement in the test escapes with Cell-Aware Patterns when compared to traditional ATPG patterns.

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