scholarly journals Assessment of the Quality of Newly Formed Bone around Titanium Alloy Implants by Using X-Ray Photoelectron Spectroscopy

2012 ◽  
Vol 2012 ◽  
pp. 1-7 ◽  
Author(s):  
Hiroshi Nakada ◽  
Toshiro Sakae ◽  
Yasuhiro Tanimoto ◽  
Mari Teranishi ◽  
Takao Kato ◽  
...  
Keyword(s):  
Titanium Alloy ◽  
Cortical Bone ◽  
Photoelectron Spectroscopy ◽  
X Ray

The aim of this study was to evaluate differences in bones quality between newly formed bone and cortical bone formed around titanium alloy implants by using X-ray photoelectron spectroscopy. As a result of narrow scan measurement at 4 weeks, the newly formed bone of C1s, P2p, O1s, and Ca2p were observed at a different peak range and strength compared with a cortical bone. At 8 weeks, the peak range and strength of newly formed bone were similar to those of cortical bone at C1s, P2p, and Ca2p, but not O1s. The results from this analysis indicate that the peaks and quantities of each element of newly formed bone were similar to those of cortical bone at 8 weeks, suggestive of a strong physicochemical resemblance.

Optimising the Growth of Few-Layer Graphene on Silicon Carbide by Nickel Silicidation

2013 ◽  
Vol 740-742 ◽  
pp. 121-124 ◽  
Author(s):  
Enrique Escobedo-Cousin ◽  
Konstantin Vassilevski ◽  
Toby Hopf ◽  
Nick G. Wright ◽  
Anthony O’Neill ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Solid Phase ◽  
Sample Surface ◽  
Device Fabrication ◽  
Solid Phase Epitaxy ◽  
X Ray ◽  
Graphene Films ◽  
Few Layer Graphene ◽  
The Impact

Few-layers graphene films (FLG) were grown by local solid phase epitaxy on a semi-insulating 6H-SiC substrate by annealing Ni films deposited on the Si and C-terminated faces of the SiC. The impact of the annealing process on the final quality of the FLG films is studied using Raman spectroscopy. X-ray photoelectron spectroscopy was used to verify the presence of graphene on the sample surface. We also demonstrate that further device fabrication steps such as dielectric deposition can be carried out without compromising the FLG films integrity.

Improving the soft X-ray reflectivity of Cr/Ti multilayers by co-deposition of B4C

2020 ◽  
Vol 27 (6) ◽  
pp. 1614-1617
Author(s):  
Jingtao Zhu ◽  
Jiayi Zhang ◽  
Haochuan Li ◽  
Yuchun Tu ◽  
Jinwen Chen ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Normal Incidence ◽  
X Rays ◽  
Interface Quality ◽  
X Ray ◽  
Water Window ◽  
Section Electron ◽  
Biology Research ◽  
Section Electron Microscopy

The `water window', covering 2.4–4.4 nm, is an important wavelength range particularly essential to biology research. Cr/Ti multilayers are one of the promising reflecting elements in this region because the near-normal-incidence reflectivity is theoretically as high as 64% at 2.73 nm. However, due to multilayer imperfections, the reported reflectivity is lower than 3% for near-normal incidence. Here, B and C were intentionally incorporated into ultra-thin Cr/Ti soft X-ray multilayers by co-deposition of B4C at the interfaces. The effect on the multilayer structure and composition has been investigated using X-ray reflectometry, X-ray photoelectron spectroscopy, and cross-section electron microscopy. It is shown that B and C are mainly bonded to Ti sites, forming a nonstoichiometric TiB x C y composition, which hinders the interface diffusion, supresses the crystallization of the Cr/Ti multilayer and dramatically improves the interface quality of Cr/TiB x C y multilayers. As a result, the near-normal-incidence reflectivity of soft X-rays increases from 4.48% to 15.75% at a wavelength of 2.73 nm.

scholarly journals Investigation on the Selenization Treatment of Kesterite Cu2Mg0.2Zn0.8Sn(S,Se)4 Films for Solar Cell

Nanomaterials ◽  
2019 ◽  
Vol 9 (7) ◽  
pp. 946 ◽  
Author(s):  
Dongyue Jiang ◽  
Yu Zhang ◽  
Yingrui Sui ◽  
Wenjie He ◽  
Zhanwu Wang ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Crystal Quality ◽  
Crystalline Quality ◽  
Soda Lime Glass ◽  
Soda Lime Glass Substrate ◽  
X Ray ◽  
Morphological Studies ◽  
Selenization Temperature

High-selenium Cu2Mg0.2Zn0.8Sn(S,Se)4 (CMZTSSe) films were prepared on a soda lime glass substrate using the sol–gel spin coating method, followed by selenization treatment. In this work, we investigated the effects of selenization temperature and selenization time on the crystal quality, and electrical and optical properties of CMZTSSe films. The study on the micro-structure by XRD, Raman, X-ray photoelectron spectroscopy (XPS), and energy-dispersive X-ray spectroscopy (EDS) analysis showed that all CMZTSSe samples had kesterite crystalline structure. In addition, the crystalline quality of CMZTSSe is improved and larger Se takes the site of S in CMZTSSe with the increase of selenization temperature and selenization time. When increasing the selenization temperature from 500 to 530 °C and increasing the annealing time from 10 to 15 min, the morphological studies showed that the microstructures of the films were dense and void-free. When further increasing the temperature and time, the crystalline quality of the films began to deteriorate. In addition, the bandgaps of CMZTSSe are tuned from 1.06 to 0.93 eV through adjusting the selenization conditions. When CMZTSSe samples are annealed at 530 °C for 15 min under Se atmosphere, the crystal quality and optical–electrical characteristics of CMZTSSe will be optimal, and the grain size and carrier concentration reach maximums of 1.5–2.5 μm and 6.47 × 1018 cm−3.

scholarly journals Adsorption of Saliva Related Protein on Denture Materials: An X-Ray Photoelectron Spectroscopy and Quartz Crystal Microbalance Study

2016 ◽  
Vol 2016 ◽  
pp. 1-9 ◽  
Author(s):  
Akiko Miyake ◽  
Satoshi Komasa ◽  
Yoshiya Hashimoto ◽  
Yutaka Komasa ◽  
Joji Okazaki
Keyword(s):  
Photoelectron Spectroscopy ◽  
Spin Coating ◽  
High Frequency ◽  
Quartz Crystal ◽  
Related Protein ◽  
Homogeneous Surface ◽  
X Ray ◽  
Different Types ◽  
The Difference

The aim of this study was to evaluate the difference in the adsorption behavior of different types of bovine salivary proteins on the PMMA and Ti QCM sensors are fabricated by spin-coating and sputtering onto bare QCM sensors by using QCM and X-ray photoelectron spectroscopy (XPS). SPM, XPS, and contact angle investigations were carried out to determine the chemical composition and surface wettability of the QCM surface. We discuss the quality of each sensor and evaluate the potential of the high-frequency QCM sensors by investigating the binding between the QCM sensor and the proteins albumin and mucin (a salivary-related protein). The SPM image showed a relatively homogeneous surface with nano-order roughness. The XPS survey spectra of the thin films coated on the sensors were similar to the binding energy of the characteristic spectra of PMMA and Ti. Additionally, the amount of salivary-related protein on the PMMA QCM sensor was higher than those on the Ti and Au QCM sensors. The difference of protein adsorption is proposed to be related to the wettability of each material. The PMMA and Ti QCM sensors are useful tools to study the adsorption and desorption of albumin and mucin on denture surfaces.

Changes of bone quality of cortical bone formed under alendronate treatment were detected by microbeam X-ray diffraction analysis

Bone ◽  
2006 ◽  
Vol 38 (3) ◽  
pp. 12-13
Author(s):  
M. Kashii ◽  
J. Hashimoto ◽  
T. Nakano ◽  
Y. Umakoshi ◽  
H. Yoshikawa
Keyword(s):  
Diffraction Analysis ◽  
Cortical Bone ◽  
Bone Quality ◽  
X Ray Diffraction ◽  
X Ray ◽  
Alendronate Treatment

scholarly journals Thermal Behavior of Single-Crystal Diamonds Catalyzed by Titanium Alloy at Elevated Temperature

2020 ◽  
Vol 10 (13) ◽  
pp. 4651
Author(s):  
Pengyu Hou ◽  
Ming Zhou ◽  
Haijun Zhang
Keyword(s):  
Titanium Alloy ◽  
Tool Wear ◽  
Single Crystal ◽  
Photoelectron Spectroscopy ◽  
Elevated Temperatures ◽  
Tool Material ◽  
Alloy Sheet ◽  
Machine Material ◽  
X Ray ◽  
Single Crystal Diamond

Single-crystal diamonds are considered as the best tool material for ultra-precision machining. However, due to its low thermal conductivity, small elastic modulus and strong chemical activity, titanium alloy has poor machinability and is a typically difficult-to-machine material. Excessive tool wear prevents diamonds from cutting titanium alloy. This study conducts a series of thermal analytic experiments under conditions of different gas atmospheres in order to research the details of thermochemical wear of diamonds catalyzed by titanium alloy at elevated temperatures. Raman scattering analysis was performed to identify the transformation of the diamond crystal structure. The change in chemical composition of the work material was detected be means of energy dispersive X-ray analysis. X-ray photoelectron spectroscopy was used to confirm the resultant interfacial thermochemical reactions. The results of the study reveal the diffusion law of the single-crystal diamond under the action of titanium in the argon and air environment. From the experimental results, the product of the chemical reaction corresponding to the interface between the diamond and the titanium alloy sheet could be found. The research results provide a theoretical basis for elucidating the wear mechanism of diamond tools in the titanium alloy cutting process and for exploring the measures to suppress tool wear.

Synthesis, Structure, and Electrochemical Properties of Li4Ti5O12

2006 ◽  
Vol 973 ◽  
Author(s):  
Chintalapalle V Ramana ◽  
Satoshi Utsunomiya ◽  
Rodney C Ewing ◽  
Udo Becker ◽  
Karim Zaghib ◽  
...  
Keyword(s):  
High Resolution ◽  
Photoelectron Spectroscopy ◽  
Electrode Materials ◽  
Negative Electrode ◽  
X Ray ◽  
Transmission Electron ◽  
Crystallographic Defects ◽  
Microscopy Techniques ◽  
Negative Electrode Materials

ABSTRACTLithium titanium oxide (Li4Ti5O12) spinels are promising negative electrode materials for application in energy technology. In this work, we have synthesized Li4Ti5O12 and investigated its structure, electronic properties, and electrochemical features using several analytical spectroscopy and microscopy techniques. The equally spaced lattice fringes obtained using by the high-resolution transmission electron microscopy (HRTEM) along with electron diffraction reveal that the grown Li4Ti5O12 is well crystallized in the spinel structure without any indication of crystallographic defects such as dislocations or misfits. The electronic structure determination using high-resolution X-ray photoelectron spectroscopy (XPS) coupled with compositional studies using energy dispersive X-ray spectrometry (EDS) indicate excellent chemical quality of the Li4Ti5O12. Under the optimal synthetic condition, the sample delivers a discharge capacity of 161 mAh/g at C/12. The good cyclability of Li4Ti5O12 is attributed to the small expansion (δV≈1%) of the elementary unit-cell.

Growth, Characterization and Spectroscopic Investigations of InI Crystals for Optical and Radiation Detector Applications

1997 ◽  
Vol 487 ◽  
Author(s):  
K. C. Mandal ◽  
M. Klugerman ◽  
L. J. Cirignano ◽  
L. P. Moy ◽  
K. S. Shah ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Grown Crystal ◽  
Radiation Detector ◽  
X Ray Diffraction ◽  
X Ray ◽  
Growth Characterization ◽  
Vertical Bridgman ◽  
Nuclear Detectors ◽  
Crystal Wafer

AbstractSingle crystals of InI (Eg = 2.01 eV at 300K) have been grown by vertical Bridgman technique using zone refined (ZR) starting materials. The quality of the grown crystal has been evaluated by X-ray diffraction (XRD), Electron probe microanalysis (EPMA) and Photoelectron spectroscopy (XPS). Chemically etched crystal wafer has been used to fabricate optical and nuclear detectors. The results are presented in this paper.

Inner surface reaction and modification of titanium alloy by a new plasma source ion implantation method

1998 ◽  
Vol 13 (7) ◽  
pp. 1823-1827 ◽  
Author(s):  
Mu Sun ◽  
Kan Xie ◽  
Si-ze Yang
Keyword(s):  
Titanium Alloy ◽  
Ion Implantation ◽  
Photoelectron Spectroscopy ◽  
Plasma Source ◽  
X Ray ◽  
Inner Surface ◽  
Plasma Source Ion Implantation ◽  
Nitrogen Ion ◽  
Modification Of Titanium ◽  
Implantation Method

The inner surface of a cylindrical titanium alloy target was successfully implanted with nitrogen ion using a new plasma source ion implantation method. By means of x-ray photoelectron spectroscopy and x-ray diffraction, the reactive phases and their chemical state in the implanted layer were investigated. In order to characterize the modification effect and its uniformity, the retained dose and the microhardness at seven different positions along the axis on the inner surface of the cylindrical target were measured, respectively. The experimental results show that a TiN reactive phase was formed in the implanted layer, which contributed to the improvement of inner surface microhardness. The root-mean-square deviations of retained dose and microhardness measured along the axis of the target are less than 9% and 4%, respectively, which are well within an acceptable tolerance range for metallic applications of ion implantation.

GROWTH OF HIGHLY (0002) ORIENTED InN FILMS ON AlInN/AlN BILAYER

2013 ◽  
Vol 20 (02) ◽  
pp. 1350015 ◽  
Author(s):  
C. J. DONG ◽  
M. XU ◽  
W. LU ◽  
Q. Z. HUANG
Keyword(s):  
Photoelectron Spectroscopy ◽  
Rf Magnetron Sputtering ◽  
Interface Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hexagonal Wurtzite Crystal Structure ◽  
Transmission Electron ◽  
Aln Buffer ◽  
Microelectronic Materials

InN film with an AlInN/AlN bilayer buffer was deposited on Si(111) substrate by radio frequency (RF) magnetron sputtering. X-ray diffraction and Raman spectroscopy measurements reveal that the InN film is of hexagonal wurtzite crystal structure with highly (0002) preferred orientation. An Al0.24In0.76N interface layer of about ~50 nm was confirmed by transmission electron microscopy (TEM) and further analyzed by X-ray photoelectron spectroscopy (XPS). The quality of this film is remarkably better than InN films grown directly on Si substrate or with only an AlN buffer, due to the effective accommodation of mismatch between the film and substrate. Our results will be very useful in the fabrication of applicable nitride microelectronic materials.

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