Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization
2012 ◽
Vol 2012
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pp. 1-5
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This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/ftype and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.
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2015 ◽
Vol 28
(1)
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pp. 17-28
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2014 ◽
Vol 92
(7/8)
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pp. 879-882
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1991 ◽
Vol 40
(1)
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pp. 2-6
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2015 ◽
Vol 19
(01-03)
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pp. 175-191
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