Ultra low-noise preamplifier for low-frequency noise measurements in electron devices

1991 ◽  
Vol 40 (1) ◽  
pp. 2-6 ◽  
Author(s):  
B. Neri ◽  
B. Pellegrini ◽  
R. Saletti
Keyword(s):  
Low Frequency ◽  
Low Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements ◽  
Electron Devices ◽  
Ultra Low Noise ◽  
Low Noise Preamplifier

scholarly journals Differential ultra low noise amplifier for low frequency noise measurements

AIP Advances ◽  
2011 ◽  
Vol 1 (2) ◽  
pp. 022144 ◽  
Author(s):  
Graziella Scandurra ◽  
Gianluca Cannatà ◽  
Carmine Ciofi
Keyword(s):  
Low Frequency ◽  
Low Noise ◽  
Low Noise Amplifier ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements ◽  
Noise Amplifier ◽  
Ultra Low Noise

scholarly journals A Low-Noise and Quasi-Ideal DC Current Source Dedicated to Four-Probe Low-Frequency Noise Measurements

2020 ◽  
Vol 69 (1) ◽  
pp. 194-200 ◽  
Author(s):  
Jean-Marc Routoure ◽  
Sheng Wu ◽  
Carlo Barone ◽  
Laurence Mechin ◽  
Bruno Guillet
Keyword(s):  
Current Source ◽  
Low Frequency ◽  
Low Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements ◽  
Dc Current

scholarly journals Single JFET Front-End Amplifier for Low Frequency Noise Measurements with Cross Correlation-Based Gain Calibration

Electronics ◽  
2019 ◽  
Vol 8 (10) ◽  
pp. 1197
Author(s):  
Graziella Scandurra ◽  
Gino Giusi ◽  
Carmine Ciofi
Keyword(s):  
Background Noise ◽  
Cross Correlation ◽  
Low Frequency ◽  
Open Loop ◽  
Low Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Front End ◽  
Voltage Amplifier ◽  
Noise Measurements

We propose an open loop voltage amplifier topology based on a single JFET front-end for the realization of very low noise voltage amplifiers to be used in the field of low frequency noise measurements. With respect to amplifiers based on differential input stages, a single transistor stage has, among others, the advantage of a lower background noise. Unfortunately, an open loop approach, while simplifying the realization, has the disadvantage that because of the dispersions in the characteristics of the active device, it cannot ensure that a well-defined gain be obtained by design. To address this issue, we propose to add two simple operational amplifier-based auxiliary amplifiers with known gain as part of the measurement chain and employ cross correlation for the calibration of the gain of the main amplifier. With proper data elaboration, gain calibration and actual measurements can be carried out at the same time. By using the approach we propose, we have been able to design a low noise amplifier relying on a simplified hardware and with background noise as low as 6 nV/√Hz at 200 mHz, 1.7 nV/√Hz at 1 Hz, 0.7 nV/√Hz at 10 Hz, and less than 0.6 nV/√Hz at frequencies above 100 Hz.

DEDICATED INSTRUMENTATION FOR HIGH SENSITIVITY, LOW FREQUENCY NOISE MEASUREMENT SYSTEMS

2004 ◽  
Vol 04 (02) ◽  
pp. L385-L402 ◽  
Author(s):  
C. CIOFI ◽  
G. GIUSI ◽  
G. SCANDURRA ◽  
B. NERI
Keyword(s):  
Background Noise ◽  
Flicker Noise ◽  
Low Frequency ◽  
High Sensitivity ◽  
Design Guidelines ◽  
Low Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Low Frequencies ◽  
Noise Measurements

Low Frequency Noise Measurements (LFNM) can be used as very sensitive tool for the characterization of the quality and the reliability of electron devices. However, especially in those cases in which the frequency range of interest extends below 1 Hz, instrumentation with an acceptable low level of background noise is not easily found on the market. In fact, at very low frequencies, the flicker noise introduced by the electronic components which make up the instrumentation becomes predominant and several interesting phenomena which could be detected by means of LFNM may result completely hidden in the background noise. This consideration is not limited to the case of input preamplifiers but does extend to any piece of instrumentation that contributes to the LFNM systems, and in particular to the power supplies used for biasing the Device Under Test. During the last few years, our research groups have been strongly involved in the design of very low noise instrumentation for application in the field of LFNM. In this work we report the main results which we have obtained together with a discussion of the design guidelines that have allowed us, in a few cases, to reach noise levels not to be equalled by any instrumentation available on the market.

scholarly journals LOW-FREQUENCY NOISE MEASUREMENTS OF IR PHOTODETECTORS WITH VOLTAGE CROSS CORRELATION SYSTEM

Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  
Keyword(s):  
Cross Correlation ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Ir Photodetectors ◽  
Noise Measurements ◽  
Correlation System
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