Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

2011 ◽  
Vol 14 (4) ◽  
pp. H177 ◽  
Author(s):  
Sheng-Yao Huang ◽  
Ting-Chang Chang ◽  
Min-Chen Chen ◽  
Shih-Ching Chen ◽  
Chih-Tsung Tsai ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Ambient Atmosphere ◽  
Positive Bias ◽  
Electrical Characteristics ◽  
Bias Temperature Stress

Hydrogen as a Cause of Abnormal Subchannel Formation Under Positive Bias Temperature Stress in a-InGaZnO Thin-Film Transistors

2019 ◽  
Vol 66 (7) ◽  
pp. 2954-2959
Author(s):  
Yu-Chieh Chien ◽  
Yi-Chieh Yang ◽  
Yu-Ching Tsao ◽  
Hsiao-Cheng Chiang ◽  
Mao-Chou Tai ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Bias Temperature Stress

Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors

2016 ◽  
Vol 108 (14) ◽  
pp. 141604 ◽  
Author(s):  
Saeroonter Oh ◽  
Ju Heyuck Baeck ◽  
Jong Uk Bae ◽  
Kwon-Shik Park ◽  
In Byeong Kang
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Excess Oxygen ◽  
Positive Bias ◽  
Bias Temperature Stress

Investigation of an anomalous hump phenomenon in via-type amorphous In-Ga-Zn-O thin-film transistors under positive bias temperature stress

2017 ◽  
Vol 110 (14) ◽  
pp. 143508 ◽  
Author(s):  
Jianwen Yang ◽  
Po-Yung Liao ◽  
Ting-Chang Chang ◽  
Bo-Wei Chen ◽  
Hui-Chun Huang ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Bias Temperature Stress
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