Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors

Saeroonter Oh; Ju Heyuck Baeck; Jong Uk Bae; Kwon-Shik Park; In Byeong Kang

doi:10.1063/1.4945404

Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors

Applied Physics Letters ◽

10.1063/1.4945404 ◽

2016 ◽

Vol 108 (14) ◽

pp. 141604 ◽

Cited By ~ 22

Author(s):

Saeroonter Oh ◽

Ju Heyuck Baeck ◽

Jong Uk Bae ◽

Kwon-Shik Park ◽

In Byeong Kang

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Excess Oxygen ◽

Positive Bias ◽

Bias Temperature Stress

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Publisher's Note: “Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors” [Appl. Phys. Lett. 108, 141604 (2016)]

Applied Physics Letters ◽

10.1063/1.4947573 ◽

2016 ◽

Vol 108 (16) ◽

pp. 169903 ◽

Cited By ~ 1

Author(s):

Saeroonter Oh ◽

Ju Heyuck Baeck ◽

Jong Uk Bae ◽

Kwon-Shik Park ◽

In Byeong Kang

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Excess Oxygen ◽

Positive Bias ◽

Bias Temperature Stress

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Hydrogen as a Cause of Abnormal Subchannel Formation Under Positive Bias Temperature Stress in a-InGaZnO Thin-Film Transistors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2913708 ◽

2019 ◽

Vol 66 (7) ◽

pp. 2954-2959

Author(s):

Yu-Chieh Chien ◽

Yi-Chieh Yang ◽

Yu-Ching Tsao ◽

Hsiao-Cheng Chiang ◽

Mao-Chou Tai ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Bias Temperature Stress

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Investigation of microwave assisted annealing on AP-PECVD fabricated In-Ga-Zn-O thin film transistors under positive bias temperature stress

2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) ◽

10.1109/nano.2016.7751474 ◽

2016 ◽

Author(s):

Chien-Hung Wu ◽

Bo-Wen Huang ◽

Kow-Ming Chang ◽

Chia-Yao Cheng ◽

Hsin-Ying Chen ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Microwave Assisted ◽

Bias Temperature Stress

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A Two-Stage Degradation Model of p-Channel Low-Temperature Poly-Si Thin-Film Transistors Under Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2160949 ◽

2011 ◽

Vol 58 (10) ◽

pp. 3501-3505 ◽

Cited By ~ 5

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Two Stage ◽

Degradation Model ◽

Bias Temperature Stress ◽

Si Thin Film

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Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

Electrochemical and Solid-State Letters ◽

10.1149/1.3534828 ◽

2011 ◽

Vol 14 (4) ◽

pp. H177 ◽

Cited By ~ 63

Author(s):

Sheng-Yao Huang ◽

Ting-Chang Chang ◽

Min-Chen Chen ◽

Shih-Ching Chen ◽

Chih-Tsung Tsai ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Ambient Atmosphere ◽

Positive Bias ◽

Electrical Characteristics ◽

Bias Temperature Stress

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21-4: Distinguished Paper : Experimental Decomposition of the Positive Bias Temperature Stress-induced Instability in Self-aligned Coplanar InGaZnO Thin-film Transistors and its Modeling based on the Multiple Stretched-exponential Functions

SID Symposium Digest of Technical Papers ◽

10.1002/sdtp.11616 ◽

2017 ◽

Vol 48 (1) ◽

pp. 298-301 ◽

Cited By ~ 3

Author(s):

Dae Hwan Kim ◽

Sungju Choi ◽

Juntae Jang ◽

Hara Kang ◽

Dong Myong Kim ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Exponential Functions ◽

Stretched Exponential ◽

Bias Temperature Stress

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Positive bias temperature stress induced degradation in p-channel poly-Si thin-film transistors

18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2011.5992774 ◽

2011 ◽

Cited By ~ 2

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Bias Temperature Stress ◽

Si Thin Film

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Two-Stage Degradation of p-Type Polycrystalline Silicon Thin-Film Transistors Under Dynamic Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2014.2359299 ◽

2014 ◽

Vol 61 (11) ◽

pp. 3751-3756 ◽

Cited By ~ 5

Author(s):

Dongli Zhang ◽

Mingxiang Wang ◽

Xiaowei Lu

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Positive Bias ◽

Silicon Thin Film ◽

Two Stage ◽

Bias Temperature Stress ◽

P Type

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Experimental decomposition of the positive bias temperature stress-induced instability in self-aligned coplanar InGaZnO thin-film transistors and its modeling based on the multiple stretched-exponential functions

Journal of the Society for Information Display ◽

10.1002/jsid.531 ◽

2017 ◽

Vol 25 (2) ◽

pp. 98-107 ◽

Cited By ~ 7

Author(s):

Dae Hwan Kim ◽

Sungju Choi ◽

Juntae Jang ◽

Hara Kang ◽

Dong Myong Kim ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Exponential Functions ◽

Stretched Exponential ◽

Bias Temperature Stress

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Investigation of an anomalous hump phenomenon in via-type amorphous In-Ga-Zn-O thin-film transistors under positive bias temperature stress

Applied Physics Letters ◽

10.1063/1.4979870 ◽

2017 ◽

Vol 110 (14) ◽

pp. 143508 ◽

Cited By ~ 8

Author(s):

Jianwen Yang ◽

Po-Yung Liao ◽

Ting-Chang Chang ◽

Bo-Wei Chen ◽

Hui-Chun Huang ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Bias Temperature Stress

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