A Two-Stage Degradation Model of p-Channel Low-Temperature Poly-Si Thin-Film Transistors Under Positive Bias Temperature Stress

Xiaowei Lu; Mingxiang Wang; Man Wong

doi:10.1109/ted.2011.2160949

A Two-Stage Degradation Model of p-Channel Low-Temperature Poly-Si Thin-Film Transistors Under Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2160949 ◽

2011 ◽

Vol 58 (10) ◽

pp. 3501-3505 ◽

Cited By ~ 5

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Two Stage ◽

Degradation Model ◽

Bias Temperature Stress ◽

Si Thin Film

Download Full-text

Two-Stage Degradation of p-Channel Poly-Si Thin-Film Transistors Under Dynamic Negative Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2158582 ◽

2011 ◽

Vol 58 (9) ◽

pp. 3034-3041 ◽

Cited By ~ 14

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Two Stage ◽

Bias Temperature Stress ◽

Si Thin Film

Download Full-text

Positive bias temperature stress induced degradation in p-channel poly-Si thin-film transistors

18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2011.5992774 ◽

2011 ◽

Cited By ~ 2

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Bias Temperature Stress ◽

Si Thin Film

Download Full-text

Two-Stage Degradation of p-Type Polycrystalline Silicon Thin-Film Transistors Under Dynamic Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2014.2359299 ◽

2014 ◽

Vol 61 (11) ◽

pp. 3751-3756 ◽

Cited By ~ 5

Author(s):

Dongli Zhang ◽

Mingxiang Wang ◽

Xiaowei Lu

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Positive Bias ◽

Silicon Thin Film ◽

Two Stage ◽

Bias Temperature Stress ◽

P Type

Download Full-text

Hydrogen as a Cause of Abnormal Subchannel Formation Under Positive Bias Temperature Stress in a-InGaZnO Thin-Film Transistors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2913708 ◽

2019 ◽

Vol 66 (7) ◽

pp. 2954-2959

Author(s):

Yu-Chieh Chien ◽

Yi-Chieh Yang ◽

Yu-Ching Tsao ◽

Hsiao-Cheng Chiang ◽

Mao-Chou Tai ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Bias Temperature Stress

Download Full-text

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Electronic Materials Letters ◽

10.1007/s13391-013-3173-4 ◽

2013 ◽

Vol 9 (S1) ◽

pp. 13-16 ◽

Cited By ~ 2

Author(s):

Yu-Mi Kim ◽

Kwang-Seok Jeong ◽

Ho-Jin Yun ◽

Seung-Dong Yang ◽

Sang-Youl Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Silicon Thin Film ◽

Poly Silicon ◽

Bias Temperature Stress

Download Full-text

Instability of p-channel poly-Si thin-film transistors under dynamic negative bias temperature stress

2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2010.5531996 ◽

2010 ◽

Cited By ~ 4

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Bias Temperature Stress ◽

Si Thin Film

Download Full-text

Publisher's Note: “Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors” [Appl. Phys. Lett. 108, 141604 (2016)]

Applied Physics Letters ◽

10.1063/1.4947573 ◽

2016 ◽

Vol 108 (16) ◽

pp. 169903 ◽

Cited By ~ 1

Author(s):

Saeroonter Oh ◽

Ju Heyuck Baeck ◽

Jong Uk Bae ◽

Kwon-Shik Park ◽

In Byeong Kang

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Excess Oxygen ◽

Positive Bias ◽

Bias Temperature Stress

Download Full-text

Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2021.3068423 ◽

2021 ◽

Vol 42 (5) ◽

pp. 712-715

Author(s):

Yu-Xuan Wang ◽

Ting-Chang Chang ◽

Mao-Chou Tai ◽

Chia-Chuan Wu ◽

Yu-Fa Tu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Degradation Behavior ◽

Silicon Thin Film ◽

Bias Temperature Stress

Download Full-text

Investigation of microwave assisted annealing on AP-PECVD fabricated In-Ga-Zn-O thin film transistors under positive bias temperature stress

2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) ◽

10.1109/nano.2016.7751474 ◽

2016 ◽

Author(s):

Chien-Hung Wu ◽

Bo-Wen Huang ◽

Kow-Ming Chang ◽

Chia-Yao Cheng ◽

Hsin-Ying Chen ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Microwave Assisted ◽

Bias Temperature Stress

Download Full-text

Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

Electrochemical and Solid-State Letters ◽

10.1149/1.3534828 ◽

2011 ◽

Vol 14 (4) ◽

pp. H177 ◽

Cited By ~ 63

Author(s):

Sheng-Yao Huang ◽

Ting-Chang Chang ◽

Min-Chen Chen ◽

Shih-Ching Chen ◽

Chih-Tsung Tsai ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Ambient Atmosphere ◽

Positive Bias ◽

Electrical Characteristics ◽

Bias Temperature Stress

Download Full-text