21-4: Distinguished Paper : Experimental Decomposition of the Positive Bias Temperature Stress-induced Instability in Self-aligned Coplanar InGaZnO Thin-film Transistors and its Modeling based on the Multiple Stretched-exponential Functions

2017 ◽  
Vol 48 (1) ◽  
pp. 298-301 ◽  
Author(s):  
Dae Hwan Kim ◽  
Sungju Choi ◽  
Juntae Jang ◽  
Hara Kang ◽  
Dong Myong Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Exponential Functions ◽  
Stretched Exponential ◽  
Bias Temperature Stress

Hydrogen as a Cause of Abnormal Subchannel Formation Under Positive Bias Temperature Stress in a-InGaZnO Thin-Film Transistors

2019 ◽  
Vol 66 (7) ◽  
pp. 2954-2959
Author(s):  
Yu-Chieh Chien ◽  
Yi-Chieh Yang ◽  
Yu-Ching Tsao ◽  
Hsiao-Cheng Chiang ◽  
Mao-Chou Tai ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Bias Temperature Stress

Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors

2016 ◽  
Vol 108 (14) ◽  
pp. 141604 ◽  
Author(s):  
Saeroonter Oh ◽  
Ju Heyuck Baeck ◽  
Jong Uk Bae ◽  
Kwon-Shik Park ◽  
In Byeong Kang
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Excess Oxygen ◽  
Positive Bias ◽  
Bias Temperature Stress

Investigation of an anomalous hump phenomenon in via-type amorphous In-Ga-Zn-O thin-film transistors under positive bias temperature stress

2017 ◽  
Vol 110 (14) ◽  
pp. 143508 ◽  
Author(s):  
Jianwen Yang ◽  
Po-Yung Liao ◽  
Ting-Chang Chang ◽  
Bo-Wei Chen ◽  
Hui-Chun Huang ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Bias Temperature Stress
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