Effect of High-temperature Annealing on Evaporated Silicon Oxide Films: A Spectroscopic Ellipsometry Study
Keyword(s):
Keyword(s):
1998 ◽
Vol 335
(1-2)
◽
pp. 253-257
◽
2002 ◽
Vol 149
(7)
◽
pp. G376
◽
Keyword(s):
Keyword(s):