Impact of Post-Oxidation Annealing on Low-Frequency Noise, Threshold Voltage, and Subthreshold Swing of p-Channel MOSFETs
2004 ◽
Vol 25
(4)
◽
pp. 211-213
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2015 ◽
Vol 54
(4S)
◽
pp. 04DC11
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2010 ◽
Vol 23
(7)
◽
pp. 545-549
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HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
(PR3)
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pp. Pr3-131-Pr3-134
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1999 ◽